Wide-field-of-view atom probe reconstruction

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 292-293

  Geiser, B P ^a   Larson, D J ^a   Oltman, E ^a   Gerstl, S ^a   Reinhard, D ^a   Kelly, T F ^a   Prosa, T J ^a  

^a Imago Scientific Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949128652     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609098249     Document Type: Article

References (5)

1. T. Kelly, et al., Rev. Sci. Instrum. 78 (2007) 031101.
2. D. Blavette, et al., Revue Phys. Appl. 17 (1982) 435.
3. P. Bas, et al., Appl. Surf. Sci. 87/88 (1995) 298.
4. M. Miller, "Atom Probe Tomography: Analysis at the Atomic Level" Kluwer Academic/Plenum Publishers, New York, 2000.
5. S. D. Walck, et al., Journal de Phys. 47-C2 (3) (1986) 451.