Shaping the lens of the atom probe: Fabrication of site specific, oriented specimens and application to grain boundary analysis

Ultramicroscopy

Volumn 111, Issue 6, 2011, Pages 435-439

  Felfern, P ^a   Ringer, S P ^a   Cairney, J M ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

Author keywords

Atom probe tomography; Focussed ion beam; Grain boundaries; Grain boundary segregation; Site specific

Indexed keywords

ATOMS; CAST IRON; CHEMICAL ELEMENTS; FOCUSED ION BEAMS; GRAIN BOUNDARIES; IONS; PROBES; SPECIMEN PREPARATION;

ATOM PROBE TOMOGRAPHY; FOCUSSED ION BEAMS; GRAIN BOUNDARY ANALYSIS; GRAIN BOUNDARY SEGREGATION; LATTICE RESOLUTION; LOW ACCELERATING VOLTAGE; SAMPLE PREPARATION METHODS; SITE-SPECIFIC;

ION BEAMS;

GALLIUM; HEAVY ELEMENT; METAL; STEEL; UNCLASSIFIED DRUG;

ANALYTIC METHOD; ARTICLE; ATOM PROBE TOMOGRAPHY; CONTAMINATION; CONTROLLED STUDY; CRYSTAL STRUCTURE; DIFFUSION; ELECTRIC POTENTIAL; EVAPORATION; FOCUSED ION BEAM; GRAIN BOUNDARY ANALYSIS; MICROANALYSIS; MOLECULAR INTERACTION; MOLECULAR PROBE; OPTICS; PARTICLE SIZE; RADIATION BEAM; REPRODUCIBILITY; SOLUTE;

EID: 79960687525     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.12.005     Document Type: Article

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