A quantitative assessment of microelectrodes

Ultramicroscopy

Volumn 109, Issue 5, 2009, Pages 497-501

  Schlesiger, Ralf ^a   Schmitz, Guido ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Atom probe tomography; Field enhancement; Finite element calculation; Local electrode

Indexed keywords

ATOM PROBE TOMOGRAPHY; COMMERCIAL INSTRUMENTS; DOWN-SCALING; EXPERIMENTAL DATUM; FIELD ENHANCEMENT; FINITE ELEMENT CALCULATION; LOCAL ELECTRODE; PRACTICAL REALIZATIONS; QUANTITATIVE ASSESSMENTS; STABLE MEASUREMENTS;

ATOMS; DIAGNOSTIC RADIOGRAPHY; ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; FINITE ELEMENT METHOD; PROBES; SURFACE DEFECTS; TOMOGRAPHY;

MICROELECTRODES;

ARTICLE; ATOM PROBE TOMOGRAPHY; ELECTRIC FIELD; FINITE ELEMENT ANALYSIS; MICROELECTRODE; QUANTITATIVE ANALYSIS; SCANNING ELECTRON MICROSCOPY; TOMOGRAPHY;

EID: 62549165140     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.11.008     Document Type: Article

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