Electron tomography using a geometric surface-tangent algorithm: Application to atom probe specimen morphology

Journal of Applied Physics

Volumn 105, Issue 10, 2009, Pages

  Petersen, T C ^a   Ringer, S P ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOM PROBE; CONVEX SHAPES; DIFFERENTIAL GEOMETRY; EDGE MAP; ELECTRON TOMOGRAPHY; FRESNEL DIFFRACTION; GEOMETRIC SURFACES; INTENSITY GRADIENTS; NANO-SIZED; RECONSTRUCTION ALGORITHMS; SCATTERING DENSITY; SIMULATED DATA;

ATOMS; DIFFRACTION; ELECTRIC IMPEDANCE TOMOGRAPHY; MORPHOLOGY; PROBES;

EDGE DETECTION;

EID: 66549084463     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3129310     Document Type: Article

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