Atom probe trajectory mapping using experimental tip shape measurements

Journal of Microscopy

Volumn 244, Issue 2, 2011, Pages 170-180

  Haley, D ^a   Petersen, T ^b   Ringer, S P ^b   Smith, G D W ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF SYDNEY   (Australia)

Author keywords

Atom probe; Finite element; Ion optics

Indexed keywords

ATOMS; FINITE ELEMENT METHOD; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NUMERICAL METHODS; PROBES; SURFACE RECONSTRUCTION;

ATOM PROBE; ATOM-PROBE TOMOGRAPHY; COMPLEX COMPOSITIONS; COMPLEXES STRUCTURE; FINITE ELEMENT; ION OPTICS; PROJECTION FUNCTION; RECONSTRUCTION METHOD; SHAPE MEASUREMENTS; TIP SHAPE;

MAPPING;

ALUMINUM; ION;

ALGORITHM; ARTICLE; ATOM PROBE TOMOGRAPHY; ATOMIC PARTICLE; CHEMICAL ANALYSIS; MEASUREMENT; PRIORITY JOURNAL; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 80054697570     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2011.03522.x     Document Type: Article

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