Evolution of tip shape during field evaporation of complex multilayer structures

Journal of Microscopy

Volumn 241, Issue 3, 2011, Pages 225-233

  Marquis, E A ^a   Geiser, B P ^b   Prosa, T J ^b   Larson, D J ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b CAMECA   (United States)

Author keywords

Atom probe tomography; Emitter shape; Multilayer

Indexed keywords

ATOMS; ELECTRIC FIELDS; EVAPORATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PROBES;

ATOM PROBE; ATOM-PROBE TOMOGRAPHY; COMPLEX MULTILAYER STRUCTURE; DIFFERENT LAYERS; EMITTER SHAPES; EVAPORATION PROCESS; FIELD-EVAPORATION; FINITE DIFFERENCE MODELS (FDM); INTERFACIAL PROPERTY; TIP SHAPE;

MULTILAYERS;

ALGORITHM; ARTICLE; ATOM PROBE TOMOGRAPHY; ELECTRIC FIELD; EVAPORATION; FILM; INSTRUMENT; MORPHOLOGY; MULTILAYER STRUCTURE; PRIORITY JOURNAL; REPRODUCIBILITY; THREE DIMENSIONAL IMAGING; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 79951522524     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2010.03421.x     Document Type: Article

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