Macroscopic electrical field distribution and field-induced surface stresses of needle-shaped field emitters

Ultramicroscopy

Volumn 111, Issue 6, 2011, Pages 397-404

  Moy, Charles K S ^a,b   Ranzi, Gianluca ^a,b   Petersen, Timothy C ^a   Ringer, Simon P ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

^b UNIVERSITY OF SYDNEY   (Australia)

Author keywords

Atom probe; Field ion microscope; Field induced surface stresses; Needle shaped emitters

Indexed keywords

ATOMS; CRYSTAL SYMMETRY; ELECTRIC IMPEDANCE TOMOGRAPHY; FINITE ELEMENT METHOD; ION MICROSCOPES; MICROSCOPES; NEEDLES; PROBES; SINGLE CRYSTALS; SURFACE PROPERTIES;

ATOM PROBE; CYLINDRICAL SYMMETRY; ELECTRICAL FIELD DISTRIBUTIONS; FIELD ION MICROSCOPE; FINITE ELEMENT MODELLING; FINITE-ELEMENT STUDY; SURFACE STRESS; THREE DIMENSIONAL MORPHOLOGY;

FAILURE (MECHANICAL);

ALUMINUM; NANOPARTICLE;

ARTICLE; ELECTRIC FIELD; ELECTRON MICROSCOPY; ELECTRON TOMOGRAPHY; FINITE ELEMENT ANALYSIS; MOLECULAR MODEL; NEEDLE; PARTICLE SIZE; POROSITY; QUANTITATIVE ANALYSIS; STATIC ELECTRICITY; SURFACE STRESS;

EID: 80052529246     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.01.024     Document Type: Article

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