On the use of simulated field-evaporated specimen apex shapes in atom probe tomography data reconstruction

Microscopy and Microanalysis

Volumn 18, Issue 5, 2012, Pages 953-963

  Larson, David J ^a   Geise, Brian P ^a   Pros, Ty J ^a   Kell, Thomas F ^a  

^a CAMECA   (United States)

Author keywords

3D microscopy; atom probe tomography; field evaporation; simulation

Indexed keywords

EID: 84868532900     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612001523     Document Type: Article

References (46)

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