Improvements in planar feature reconstructions in atom probe tomography

Journal of Microscopy

Volumn 243, Issue 1, 2011, Pages 15-30

  Larson, D J ^a,b   Geiser, B P ^a   Prosa, T J ^a   Gerstl, S S A ^a   Reinhard, D A ^a   Kelly, T F ^a  

^a CAMECA   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Atom probe microscopy; Data analysis; Reconstruction

Indexed keywords

ATOMS; EVAPORATION; IMAGE RECONSTRUCTION; INTERFACES (MATERIALS); MODEL STRUCTURES; REPAIR; SINGLE CRYSTALS; SURFACE RECONSTRUCTION;

ATOM PROBE MICROSCOPIES; ATOM-PROBE TOMOGRAPHY; FEATURE RECONSTRUCTION; FIELD-EVAPORATION; POINT PROJECTION; RECONSTRUCTION; RECONSTRUCTION ARTIFACTS; RECONSTRUCTION TECHNIQUES; SPATIAL RECONSTRUCTION; VARIABLE PROJECTION;

PROBES;

ION;

ARTICLE; ARTIFACT; ATOM PROBE TOMOGRAPHY; ELECTRON MICROSCOPY; EVAPORATION SIMULATION; FIELD ION MICROSCOPY; PLANAR RECONSTRUCTION; PRIORITY JOURNAL; SIMULATION; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 79251596323     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2010.03474.x     Document Type: Article

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