Toward a laser assisted wide-angle tomographic atom-probe

Surface and Interface Analysis

Volumn 39, Issue 2-3, 2007, Pages 278-282

  Deconihout, B ^a   Vurpillot, F ^a   Gault, B ^a   Da Costa, G ^a   Bouet, M ^a   Bostel, A ^a   Blavette, D ^a   Hideur, A ^b   Martel, G ^b   Brunel, M ^b  

^a UNIVERSITÉ ET INSA DE ROUEN   (France)

^b University of Rouen Normandy   (France)

Author keywords

Field evaporation; Fs laser; Laser 3D atom probe

Indexed keywords

INSULATING MATERIALS; LASER PULSES; SEMICONDUCTOR LASERS; TOMOGRAPHY;

ENERGY COMPENSATING DEVICES; FEMTOSECOND LASER PULSES; FIELD EVAPORATION; LASER 3D ATOM PROBES;

PROBES;

EID: 33847016409     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2491     Document Type: Conference Paper

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