SCOPUS 정보 검색 플랫폼

Volumn 89, Issue 1-3, 2001, Pages 137-144

A new approach to the interpretation of atom probe field-ion microscopy images

Author keywords

Atom probe; Field desorption image; Field evaporation; Field ion microscope; Simulation

Indexed keywords

ATOMS; ELECTRIC FIELDS; MICROSCOPIC EXAMINATION; PROBES;

ION TRAJECTORIES;

IMAGE PROCESSING;

ACCURACY; ARTICLE; COMPUTER MODEL; COMPUTER SIMULATION; CONTRAST; ELECTRON TRANSPORT; FIELD ION MICROSCOPY; IMAGING; MICROSCOPY; TECHNIQUE;

EID: 0035188217 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(01)00097-3 Document Type: Article

Times cited : (47)

References (18)

1
- 0006679944
- Atom Probe Field Ion Microscopy, Oxford: Clarendon Press
- (1996)
- Miller, M.K.¹ Cerezo, A.² Hetherington, M.G.³ Smith, G.D.W.⁴

2
- 0006720004
- Field-Ion Microscopy, New York: Plenum Press
- (1968)
- Hren, J.J.¹ Ranganathan, S.²

6
- 0006639064
- M.K. Miller, A. Cerezo, M.G. Hetherington, G.D.W. Smith, Atom Probe Field Ion Microscopy, Clarendon Press, Oxford, 1996, p. 8.

7
- 0006639065
- M.K. Miller, A. Cerezo, M.G. Hetherington, G.D.W. Smith, Atom Probe Field Ion Microscopy, Clarendon Press, Oxford, 1996, pp. 152-199.

8
- 0026141086
- (1991) Surf. Sci. , vol.246 , pp. 442
- Miller, M.K.¹ Hetherington, M.G.²

11
- 0006676980
- E. Durand, Electrostatique et Electromagnetisme, Masson Cie, Paris, 1953.

13
- 0006639066
- K.M. Bowkett, D.A. Smith, Field-Ion Microscopy, North-Holland Publishing Company, Amsterdam-London, 1970, p. 202.

18
- 0006640868
- D. Blavette, F. Vurpillot, P. Pareige, A. Menand, these proceedings.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.