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Volumn 2013, Issue , 2013, Pages

Interfacial reaction of Sn-Ag-Cu lead-free solder alloy on Cu: A review

Author keywords

[No Author keywords available]

Indexed keywords

INTERCONNECT MATERIALS; MINIATURIZATION TECHNOLOGIES; MODERN MICROELECTRONICS; MORPHOLOGY EVOLUTION; SN-AG-CU LEAD-FREE SOLDERS; SN-AG-CU SOLDER ALLOYS; SNAGCU SOLDER; STRUCTURAL PHASIS;

EID: 84876553516     PISSN: 16878434     EISSN: 16878442     Source Type: Journal    
DOI: 10.1155/2013/123697     Document Type: Review
Times cited : (77)

References (65)
  • 1
    • 0037463944 scopus 로고    scopus 로고
    • Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints
    • 10.1016/S0925-8388(02)01166-0
    • Kim K. S., Huh S. H., Suganuma K., Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints. Journal of Alloys and Compounds 2003 352 1-2 226 236 10.1016/S0925-8388(02)01166-0
    • (2003) Journal of Alloys and Compounds , vol.352 , Issue.1-2 , pp. 226-236
    • Kim, K.S.1    Huh, S.H.2    Suganuma, K.3
  • 2
    • 15544387649 scopus 로고    scopus 로고
    • IMC morphology, interfacial reaction and joint reliability of Pb-free Sn-Ag-Cu solder on electrolytic Ni BGA substrate
    • DOI 10.1016/j.jallcom.2004.09.045, PII S0925838804012356
    • Yoon J.-W., Kim S.-W., Jung S.-B., IMC morphology, interfacial reaction and joint reliability of Pb-free Sn-Ag-Cu solder on electrolytic Ni BGA substrate. Journal of Alloys and Compounds 2005 392 1-2 247 252 2-s2.0-15544387649 10.1016/j.jallcom.2004.09.045 (Pubitemid 40402902)
    • (2005) Journal of Alloys and Compounds , vol.392 , Issue.1-2 , pp. 247-252
    • Yoon, J.-W.1    Kim, S.-W.2    Jung, S.-B.3
  • 3
    • 42949112013 scopus 로고    scopus 로고
    • The growth and roughness evolution of intermetallic compounds of Sn-Ag-Cu/Cu interface during soldering reaction
    • DOI 10.1016/j.jallcom.2007.04.047, PII S0925838807008602
    • Yu D. Q., Wang L., The growth and roughness evolution of intermetallic compounds of Sn-Ag-Cu/Cu interface during soldering reaction. Journal of Alloys and Compounds 2008 458 1-2 542 547 10.1016/j.jallcom.2007.04.047 (Pubitemid 351621067)
    • (2008) Journal of Alloys and Compounds , vol.458 , Issue.1-2 , pp. 542-547
    • Yu, D.Q.1    Wang, L.2
  • 5
    • 33645566980 scopus 로고    scopus 로고
    • Interfacial reactions of Sn-Ag-Cu solders modified by minor Zn alloying addition
    • 2-s2.0-33645566980 10.1007/BF02690535
    • Kang S. K., Leonard D., Shih D. A. Y., Gignac L., Henderson D. W., Cho S., Yu J., Interfacial reactions of Sn-Ag-Cu solders modified by minor Zn alloying addition. Journal of Electronic Materials 2006 35 3 479 485 2-s2.0-33645566980 10.1007/BF02690535
    • (2006) Journal of Electronic Materials , vol.35 , Issue.3 , pp. 479-485
    • Kang, S.K.1    Leonard, D.2    Shih, D.A.Y.3    Gignac, L.4    Henderson, D.W.5    Cho, S.6    Yu, J.7
  • 7
    • 1642324965 scopus 로고    scopus 로고
    • Properties of lead-free solder alloys with rare earth element additions
    • 2-s2.0-1642324965 10.1016/j.mser.2004.01.001
    • Wu C. M. L., Yu D. Q., Law C. M. T., Wang L., Properties of lead-free solder alloys with rare earth element additions. Materials Science and Engineering R 2004 44 1 1 44 2-s2.0-1642324965 10.1016/j.mser.2004.01.001
    • (2004) Materials Science and Engineering R , vol.44 , Issue.1 , pp. 1-44
    • Wu, C.M.L.1    Yu, D.Q.2    Law, C.M.T.3    Wang, L.4
  • 9
    • 27744561345 scopus 로고    scopus 로고
    • Sn-0.7 wt.%Cu/Ni interfacial reactions at 250 °c
    • DOI 10.1016/j.actamat.2005.09.006, PII S1359645405005306
    • Wang C. H., Chen S. W., Sn-0.7 wt.%Cu/Ni interfacial reactions at 250°C. Acta Materialia 2006 54 1 247 253 2-s2.0-27744561345 10.1016/j.actamat.2005.09.006 (Pubitemid 41587910)
    • (2006) Acta Materialia , vol.54 , Issue.1 , pp. 247-253
    • Wang, C.-H.1    Chen, S.-W.2
  • 10
    • 11244336699 scopus 로고    scopus 로고
    • Characteristics of intermetallics and micromechanical properties during thermal ageing of Sn-Ag-Cu flip-chip solder interconnects
    • DOI 10.1016/j.msea.2004.10.007, PII S092150930401250X
    • Li D., Liu C., Conway P. P., Characteristics of intermetallics and micromechanical properties during thermal ageing of Sn-Ag-Cu flip-chip solder interconnects. Materials Science and Engineering A 2005 391 1-2 95 103 2-s2.0-11244336699 10.1016/j.msea.2004.10.007 (Pubitemid 40071762)
    • (2005) Materials Science and Engineering A , vol.391 , Issue.1-2 , pp. 95-103
    • Li, D.1    Liu, C.2    Conway, P.P.3
  • 11
    • 77349122538 scopus 로고    scopus 로고
    • Failure mechanisms of solder interconnects under current stressing in advanced electronic packages
    • 2-s2.0-77349122538 10.1016/j.pmatsci.2010.01.001
    • Chan Y. C., Yang D., Failure mechanisms of solder interconnects under current stressing in advanced electronic packages. Progress in Materials Science 2010 55 5 428 475 2-s2.0-77349122538 10.1016/j.pmatsci.2010.01.001
    • (2010) Progress in Materials Science , vol.55 , Issue.5 , pp. 428-475
    • Chan, Y.C.1    Yang, D.2
  • 13
    • 77956094965 scopus 로고    scopus 로고
    • The influence of addition of Al nano-particles on the microstructure and shear strength of eutectic Sn-Ag-Cu solder on Au/Ni metallized Cu pads
    • 2-s2.0-77956094965 10.1016/j.jallcom.2010.06.180
    • Gain A. K., Fouzder T., Chan Y. C., Sharif A., Wong N. B., Yung W. K. C., The influence of addition of Al nano-particles on the microstructure and shear strength of eutectic Sn-Ag-Cu solder on Au/Ni metallized Cu pads. Journal of Alloys and Compounds 2010 506 1 216 223 2-s2.0-77956094965 10.1016/j.jallcom. 2010.06.180
    • (2010) Journal of Alloys and Compounds , vol.506 , Issue.1 , pp. 216-223
    • Gain, A.K.1    Fouzder, T.2    Chan, Y.C.3    Sharif, A.4    Wong, N.B.5    Yung, W.K.C.6
  • 16
    • 0033747819 scopus 로고    scopus 로고
    • Lead-free solders in microelectronics
    • 2-s2.0-0033747819 10.1016/S0927-796X(00)00010-3
    • Abtew M., Selvaduray G., Lead-free solders in microelectronics. Materials Science and Engineering R 2000 27 5 95 141 2-s2.0-0033747819 10.1016/S0927-796X(00)00010-3
    • (2000) Materials Science and Engineering R , vol.27 , Issue.5 , pp. 95-141
    • Abtew, M.1    Selvaduray, G.2
  • 17
    • 20344388336 scopus 로고    scopus 로고
    • Interfacial reactions between lead-free solders and common base materials
    • DOI 10.1016/j.mser.2005.03.001, PII S0927796X05000513
    • Laurila T., Vuorinen V., Kivilahti J. K., Interfacial reactions between lead-free solders and common base materials. Materials Science and Engineering R 2005 49 1-2 1 60 2-s2.0-20344388336 10.1016/j.mser.2005.03.001 (Pubitemid 40788671)
    • (2005) Materials Science and Engineering R: Reports , vol.49 , Issue.1-2 , pp. 1-60
    • Laurila, T.1    Vuorinen, V.2    Kivilahti, J.K.3
  • 19
    • 84874353392 scopus 로고    scopus 로고
    • Interfacial reaction of a Sn-3.0Ag-0.5Cu thin film during solder reflow
    • Lee L. M., Haliman H., Mohamad A. A., Interfacial reaction of a Sn-3.0Ag-0.5Cu thin film during solder reflow. Soldering & Surface Mount Technology 2013 25 1 15 23
    • (2013) Soldering & Surface Mount Technology , vol.25 , Issue.1 , pp. 15-23
    • Lee, L.M.1    Haliman, H.2    Mohamad, A.A.3
  • 20
    • 84867233067 scopus 로고    scopus 로고
    • Corrosion behavior of Sn-3.0Ag-0.5Cu lead-free solder in potassium hydroxide electrolyte
    • 10.1007/s11661-012-1194-5
    • Liew M. C., Ahmad I., Lee L. M., Nazeri M. F. M., Haliman H., Mohamad A. A., Corrosion behavior of Sn-3.0Ag-0.5Cu lead-free solder in potassium hydroxide electrolyte. Metallurgical and Materials Transactions A 2012 43 10 3742 3747 10.1007/s11661-012-1194-5
    • (2012) Metallurgical and Materials Transactions A , vol.43 , Issue.10 , pp. 3742-3747
    • Liew, M.C.1    Ahmad, I.2    Lee, L.M.3    Nazeri, M.F.M.4    Haliman, H.5    Mohamad, A.A.6
  • 23
    • 61449215388 scopus 로고    scopus 로고
    • Interfacial intermetallic growth and shear strength of lead-free composite solder joints
    • 2-s2.0-61449215388 10.1016/j.jallcom.2008.05.070
    • Nai S. M. L., Wei J., Gupta M., Interfacial intermetallic growth and shear strength of lead-free composite solder joints. Journal of Alloys and Compounds 2009 473 1-2 100 106 2-s2.0-61449215388 10.1016/j.jallcom.2008.05.070
    • (2009) Journal of Alloys and Compounds , vol.473 , Issue.1-2 , pp. 100-106
    • Nai, S.M.L.1    Wei, J.2    Gupta, M.3
  • 24
    • 0036961278 scopus 로고    scopus 로고
    • The chemical modeling of electronic materials and interconnections
    • 2-s2.0-0036961278
    • Kivilahti J. K., The chemical modeling of electronic materials and interconnections. JOM 2002 54 12 52 57 2-s2.0-0036961278
    • (2002) JOM , vol.54 , Issue.12 , pp. 52-57
    • Kivilahti, J.K.1
  • 25
    • 29244476511 scopus 로고    scopus 로고
    • Effect of adding 1 wt% Bi into the Sn-2.8Ag-0.5Cu solder alloy on the intermetallic formations with Cu-substrate during soldering and isothermal aging
    • DOI 10.1016/j.jallcom.2005.06.050, PII S0925838805011370
    • Rizvi M. J., Chan Y. C., Bailey C., Lu H., Islam M. N., Effect of adding 1 wt% Bi into the Sn-2.8Ag-0.5Cu solder alloy on the intermetallic formations with Cu-substrate during soldering and isothermal aging. Journal of Alloys and Compounds 2006 407 1-2 208 214 2-s2.0-29244476511 10.1016/j.jallcom.2005.06.050 (Pubitemid 41827869)
    • (2006) Journal of Alloys and Compounds , vol.407 , Issue.1-2 , pp. 208-214
    • Rizvi, M.J.1    Chan, Y.C.2    Bailey, C.3    Lu, H.4    Islam, M.N.5
  • 26
    • 76549124422 scopus 로고    scopus 로고
    • The adsorption of Ag3Sn nano-particles on Cu-Sn intermetallic compounds of Sn-3Ag-0.5Cu/Cu during soldering
    • 2-s2.0-76549124422 10.1016/j.jallcom.2009.11.131
    • Liu X., Huang M., Zhao Y., Wu C. M. L., Wang L., The adsorption of Ag3Sn nano-particles on Cu-Sn intermetallic compounds of Sn-3Ag-0.5Cu/Cu during soldering. Journal of Alloys and Compounds 2010 492 1-2 433 438 2-s2.0-76549124422 10.1016/j.jallcom.2009.11.131
    • (2010) Journal of Alloys and Compounds , vol.492 , Issue.1-2 , pp. 433-438
    • Liu, X.1    Huang, M.2    Zhao, Y.3    Wu, C.M.L.4    Wang, L.5
  • 27
    • 34247626932 scopus 로고    scopus 로고
    • Intermetallic compound formation at Sn-3.0Ag-0.5Cu-1.0Zn lead-free solder alloy/Cu interface during as-soldered and as-aged conditions
    • DOI 10.1016/j.jallcom.2006.08.012, PII S0925838806010371
    • Wang F.-J., Yu Z.-S., Qi K., Intermetallic compound formation at Sn-3.0Ag-0.5Cu-1.0Zn lead-free solder alloy/Cu interface during as-soldered and as-aged conditions. Journal of Alloys and Compounds 2007 438 1-2 110 115 (Pubitemid 46679187)
    • (2007) Journal of Alloys and Compounds , vol.438 , Issue.1-2 , pp. 110-115
    • Wang, F.-J.1    Yu, Z.-S.2    Qi, K.3
  • 28
    • 34247104974 scopus 로고    scopus 로고
    • Effect of copper addition on the microstructure and mechanical properties of lead free solder alloy
    • DOI 10.1016/j.msea.2006.12.084, PII S0921509306027481
    • Kar A., Ghosh M., Ray A. K., Ghosh R. N., Effect of copper addition on the microstructure and mechanical properties of lead free solder alloy. Materials Science and Engineering A 2007 459 1-2 69 74 2-s2.0-34247104974 10.1016/j.msea.2006.12.084 (Pubitemid 46586108)
    • (2007) Materials Science and Engineering A , vol.459 , Issue.1-2 , pp. 69-74
    • Kar, A.1    Ghosh, M.2    Ray, A.K.3    Ghosh, R.N.4
  • 29
    • 33645537269 scopus 로고    scopus 로고
    • Effects of Co and Ni addition on reactive diffusion between Sn-3.5Ag solder and Cu during soldering and annealing
    • 2-s2.0-33645537269 10.1016/j.msea.2006.01.032
    • Gao F., Takemoto T., Nishikawa H., Effects of Co and Ni addition on reactive diffusion between Sn-3.5Ag solder and Cu during soldering and annealing. Materials Science and Engineering A 2006 420 1-2 39 46 2-s2.0-33645537269 10.1016/j.msea.2006.01.032
    • (2006) Materials Science and Engineering A , vol.420 , Issue.1-2 , pp. 39-46
    • Gao, F.1    Takemoto, T.2    Nishikawa, H.3
  • 30
    • 70350237049 scopus 로고    scopus 로고
    • Wettability and interfacial reactions of Sn-Ag-Cu/Cu and Sn-Ag-Ni/Cu solder joints
    • 10.1016/j.jallcom.2009.06.159
    • Yoon J.-W., Noh B.-I., Kim B.-K., Shur C.-C., Jung S.-B., Wettability and interfacial reactions of Sn-Ag-Cu/Cu and Sn-Ag-Ni/Cu solder joints. Journal of Alloys and Compounds 2009 486 1-2 142 147 10.1016/j.jallcom.2009.06.159
    • (2009) Journal of Alloys and Compounds , vol.486 , Issue.1-2 , pp. 142-147
    • Yoon, J.-W.1    Noh, B.-I.2    Kim, B.-K.3    Shur, C.-C.4    Jung, S.-B.5
  • 31
    • 35748940610 scopus 로고    scopus 로고
    • Effect of surface finish on interfacial reactions of Cu/Sn-Ag-Cu/Cu(ENIG) sandwich solder joints
    • DOI 10.1016/j.jallcom.2006.10.052, PII S0925838806016239
    • Yoon J.-W., Jung S.-B., Effect of surface finish on interfacial reactions of Cu/Sn-Ag-Cu/Cu(ENIG) sandwich solder joints. Journal of Alloys and Compounds 2008 448 1-2 177 184 2-s2.0-35748940610 10.1016/j.jallcom.2006.10.052 (Pubitemid 350051840)
    • (2008) Journal of Alloys and Compounds , vol.448 , Issue.1-2 , pp. 177-184
    • Yoon, J.-W.1    Jung, S.-B.2
  • 32
    • 0035359916 scopus 로고    scopus 로고
    • Growth of η phase scallops and whiskers in liquid tin-solid copper reaction couples
    • Gagliano R. A., Fine M. E., Growth of η phase scallops and whiskers in liquid tin-solid copper reaction couples. JOM 2001 53 6 33 38 2-s2.0-0035359916 (Pubitemid 32672682)
    • (2001) JOM , vol.53 , Issue.6 , pp. 33-38
    • Gagliano, R.A.1    Fine, M.E.2
  • 33
    • 51349121097 scopus 로고    scopus 로고
    • Effect of Ag content on the microstructure of Sn-Ag-Cu based solder alloys
    • 2-s2.0-51349121097 10.1108/09540910810902651
    • Reid M., Punch J., Collins M., Ryan C., Effect of Ag content on the microstructure of Sn-Ag-Cu based solder alloys. Soldering and Surface Mount Technology 2008 20 4 3 8 2-s2.0-51349121097 10.1108/09540910810902651
    • (2008) Soldering and Surface Mount Technology , vol.20 , Issue.4 , pp. 3-8
    • Reid, M.1    Punch, J.2    Collins, M.3    Ryan, C.4
  • 34
    • 34447265528 scopus 로고    scopus 로고
    • 3Sn in Sn-Ag-Cu alloys and their influence on the vibration fracture properties
    • DOI 10.1016/j.msea.2007.04.121, PII S0921509307010441
    • Song J. M., Lin J. J., Huang C. F., Chuang H. Y., Crystallization, morphology and distribution of Ag3Sn in Sn-Ag-Cu alloys and their influence on the vibration fracture properties. Materials Science and Engineering A 2007 466 1-2 9 17 2-s2.0-34447265528 10.1016/j.msea.2007.04.121 (Pubitemid 47046610)
    • (2007) Materials Science and Engineering A , vol.466 , Issue.1-2 , pp. 9-17
    • Song, J.-M.1    Lin, J.-J.2    Huang, C.-F.3    Chuang, H.-Y.4
  • 35
    • 0037076832 scopus 로고    scopus 로고
    • Six cases of reliability study of Pb-free solder joints in electronic packaging technology
    • 2-s2.0-0037076832
    • Zeng K., Tu K. N., Six cases of reliability study of Pb-free solder joints in electronic packaging technology. Materials Science and Engineering R 2002 38 2 55 105 2-s2.0-0037076832
    • (2002) Materials Science and Engineering R , vol.38 , Issue.2 , pp. 55-105
    • Zeng, K.1    Tu, K.N.2
  • 37
    • 9444265297 scopus 로고    scopus 로고
    • Microstructural instability in coated single crystal superalloys
    • 2-s2.0-9444265297 10.1016/j.jmatprotec.2004.04.132
    • Reid M., Pomeroy M. J., Robinson J. S., Microstructural instability in coated single crystal superalloys. Journal of Materials Processing Technology 2004 153-154 1-3 660 665 2-s2.0-9444265297 10.1016/j.jmatprotec.2004.04.132
    • (2004) Journal of Materials Processing Technology , vol.153-154 , Issue.1-3 , pp. 660-665
    • Reid, M.1    Pomeroy, M.J.2    Robinson, J.S.3
  • 38
    • 36449009293 scopus 로고
    • Three-dimensional morphology of a very rough interface formed in the soldering reaction between eutectic SnPb and Cu
    • 2-s2.0-36449009293
    • Kim H. K., Liou H. K., Tu K. N., Three-dimensional morphology of a very rough interface formed in the soldering reaction between eutectic SnPb and Cu. Applied Physics Letters 1995 66 16 2337 2339 2-s2.0-36449009293
    • (1995) Applied Physics Letters , vol.66 , Issue.16 , pp. 2337-2339
    • Kim, H.K.1    Liou, H.K.2    Tu, K.N.3
  • 39
    • 0000072496 scopus 로고    scopus 로고
    • Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening
    • 2-s2.0-0000072496
    • Kim H. K., Tu K. N., Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening. Physical Review B 1996 53 23 16027 16034 2-s2.0-0000072496
    • (1996) Physical Review B , vol.53 , Issue.23 , pp. 16027-16034
    • Kim, H.K.1    Tu, K.N.2
  • 40
    • 0001138647 scopus 로고    scopus 로고
    • 5 spheroids in the soldering reaction of eutectic SnPb on Cr/Cu/Au thin films
    • Liu A. A., Kim H. K., Tu K. N., Totta P. A., Spalling of Cu6Sn5 spheroids in the soldering reaction of eutectic SnPb on Cr/Cu/Au thin films. Journal of Applied Physics 1996 80 5 2774 2780 2-s2.0-0001138647 (Pubitemid 126628408)
    • (1996) Journal of Applied Physics , vol.80 , Issue.5 , pp. 2774-2780
    • Liu, A.A.1    Kim, H.K.2    Tu, K.N.3    Totta, P.A.4
  • 41
    • 0029223405 scopus 로고
    • Rapid formation of intermetallic compounds interdiffusion in the CuSn and NiSn systems
    • 2-s2.0-0029223405
    • Bader S., Gust W., Hieber H., Rapid formation of intermetallic compounds interdiffusion in the CuSn and NiSn systems. Acta Metallurgica et Materialia 1995 43 1 329 337 2-s2.0-0029223405
    • (1995) Acta Metallurgica et Materialia , vol.43 , Issue.1 , pp. 329-337
    • Bader, S.1    Gust, W.2    Hieber, H.3
  • 42
    • 0034240674 scopus 로고    scopus 로고
    • Formation and growth of interfacial intermetallic layers in eutectic Sn-Ag solder and its composite solder joints
    • DOI 10.1023/A:1008968518512
    • Choi S., Lucas J. P., Subramanian K. N., Bieler T. R., Formation and growth of interfacial intermetallic layers in eutectic Sn-Ag solder and its composite solder joints. Journal of Materials Science 2000 11 6 497 502 2-s2.0-0034240674 10.1023/A:1008968518512 (Pubitemid 32076403)
    • (2000) Journal of Materials Science: Materials in Electronics , vol.11 , Issue.6 , pp. 497-502
    • Choi, S.1    Lucas, J.P.2    Subramanian, K.N.3    Bieler, T.R.4
  • 43
    • 0035252480 scopus 로고    scopus 로고
    • Growth kinetics of intermetallic compounds in chip scale package solder joint
    • DOI 10.1016/S1359-6462(00)00590-X
    • Tu P. L., Chan Y. C., Hung K. C., Lai J. K. L., Growth kinetics of intermetallic compounds in chip scale package solder joint. Scripta Materialia 2001 44 2 317 323 2-s2.0-0035252480 10.1016/S1359-6462(00)00590-X (Pubitemid 32195730)
    • (2001) Scripta Materialia , vol.44 , Issue.2 , pp. 317-323
    • Tu, P.L.1    Chan, Y.C.2    Hung, K.C.3    Lai, J.K.L.4
  • 44
    • 0030181064 scopus 로고    scopus 로고
    • Interfacial reactions during soldering with lead-tin eutectic and lead (Pb)-free, tin-rich solders
    • Kang S. K., Rai R. S., Purushothaman S., Interfacial reactions during soldering with lead-tin eutectic and lead (Pb)-free, tin-rich solders. Journal of Electronic Materials 1996 25 7 1113 1120 2-s2.0-0030181064 (Pubitemid 126541919)
    • (1996) Journal of Electronic Materials , vol.25 , Issue.7 , pp. 1113-1120
    • Kang, S.K.1    Rai, R.S.2    Purushothaman, S.3
  • 45
    • 0032208001 scopus 로고    scopus 로고
    • Theory for intermetallic phase growth between Cu and liquid Sn-Pb solder based on grain boundary diffusion control
    • Schaefer M., Fournelle R. A., Liang J., Theory for intermetallic phase growth between Cu and liquid Sn-Pb solder based on grain boundary diffusion control. Journal of Electronic Materials 1998 27 11 1167 1176 2-s2.0-0032208001 (Pubitemid 128573780)
    • (1998) Journal of Electronic Materials , vol.27 , Issue.11 , pp. 1167-1176
    • Schaefer, M.1    Fournelle, R.A.2    Liang, J.3
  • 46
    • 0035484575 scopus 로고    scopus 로고
    • Effects of microstructural evolution and intermetallic layer growth on shear strength of ball-grid-array Sn-Cu solder joints
    • Shin C. K., Baik Y. J., Huh J. Y., Effects of microstructural evolution and intermetallic layer growth on shear strength of ball-grid-array Sn-Cu solder joints. Journal of Electronic Materials 2001 30 10 1323 1331 2-s2.0-0035484575 (Pubitemid 33113847)
    • (2001) Journal of Electronic Materials , vol.30 , Issue.10 , pp. 1323-1331
    • Shin, C.K.1    Baik, Y.-J.2    Huh, J.Y.3
  • 47
    • 23844545543 scopus 로고    scopus 로고
    • Investigations of interfacial reactions of Sn-Zn based and Sn-Ag-Cu lead-free solder alloys as replacement for Sn-Pb solder
    • DOI 10.1016/j.jallcom.2005.03.053, PII S0925838805002860
    • Islam M. N., Chan Y. C., Rizvi M. J., Jillek W., Investigations of interfacial reactions of Sn-Zn based and Sn-Ag-Cu lead-free solder alloys as replacement for Sn-Pb solder. Journal of Alloys and Compounds 2005 400 1-2 136 144 2-s2.0-23844545543 10.1016/j.jallcom.2005.03.053 (Pubitemid 41165434)
    • (2005) Journal of Alloys and Compounds , vol.400 , Issue.1-2 , pp. 136-144
    • Islam, M.N.1    Chan, Y.C.2    Rizvi, M.J.3    Jillek, W.4
  • 48
    • 0031139581 scopus 로고    scopus 로고
    • Prediction of interface reaction products between Cu and various solder alloys by thermodynamic calculation
    • PII S1359645496003254
    • Lee B. J., Hwang N. M., Lee H. M., Prediction of interface reaction products between Cu and various solder alloys by thermodynamic calculation. Acta Materialia 1997 45 5 1867 1874 2-s2.0-0031139581 (Pubitemid 127371121)
    • (1997) Acta Materialia , vol.45 , Issue.5 , pp. 1867-1874
    • Lee, B.-J.1    Hwang, N.M.2    Lee, H.M.3
  • 49
    • 26244451760 scopus 로고    scopus 로고
    • Early stages of soldering reactions
    • DOI 10.1063/1.2058186, 063525
    • Lord R. A., Umantsev A., Early stages of soldering reactions. Journal of Applied Physics 2005 98 6 11 063525 10.1063/1.2058186 (Pubitemid 41415313)
    • (2005) Journal of Applied Physics , vol.98 , Issue.6 , pp. 1-11
    • Lord, R.A.1    Umantsev, A.2
  • 50
    • 21044446976 scopus 로고    scopus 로고
    • On the mechanism of the binary Cu/Sn solder reaction
    • DOI 10.1063/1.1852724, 053106
    • Görlich J., Schmitz G., Tu K. N., On the mechanism of the binary Cu/Sn solder reaction. Applied Physics Letters 2005 86 5 3 053106 10.1063/1.1852724 (Pubitemid 40870892)
    • (2005) Applied Physics Letters , vol.86 , Issue.5 , pp. 1-3
    • Gorlich, J.1    Schmitz, G.2    Tu, K.N.3
  • 51
    • 0033222027 scopus 로고    scopus 로고
    • Characterization of the growth of intermetallic interfacial layers of Sn-Ag and Sn-Pb eutectic solders and their composite solders on Cu substrate during isothermal long-term aging
    • Choi S., Bieler T. R., Lucas J. P., Subramanian K. N., Characterization of the growth of intermetallic interfacial layers of Sn-Ag and Sn-Pb eutectic solders and their composite solders on Cu substrate during isothermal long-term aging. Journal of Electronic Materials 1999 28 11 1209 1215 2-s2.0-0033222027 (Pubitemid 32082856)
    • (1999) Journal of Electronic Materials , vol.28 , Issue.11 , pp. 1209-1215
    • Choi, S.1    Bieler, T.R.2    Lucas, J.P.3    Subramanian, K.N.4
  • 52
    • 0034293761 scopus 로고    scopus 로고
    • Effect of soldering and aging time on interfacial microstructure and growth of intermetallic compounds between Sn-3.5Ag solder alloy and Cu substrate
    • 2-s2.0-0034293761
    • Choi W. K., Lee H. M., Effect of soldering and aging time on interfacial microstructure and growth of intermetallic compounds between Sn-3.5Ag solder alloy and Cu substrate. Journal of Electronic Materials 2000 29 10 1207 1213 2-s2.0-0034293761
    • (2000) Journal of Electronic Materials , vol.29 , Issue.10 , pp. 1207-1213
    • Choi, W.K.1    Lee, H.M.2
  • 53
    • 0032180855 scopus 로고    scopus 로고
    • An overview of surface finishes and their role in printed circuit board solderability and solder joint performance
    • 2-s2.0-0032180855
    • Vianco P. T., An overview of surface finishes and their role in printed circuit board solderability and solder joint performance. Circuit World 1999 25 1 6 24 2-s2.0-0032180855
    • (1999) Circuit World , vol.25 , Issue.1 , pp. 6-24
    • Vianco, P.T.1
  • 54
    • 51649143798 scopus 로고
    • The growth of Cu-Sn intermetallics at a pretinned copper-solder interface
    • 2-s2.0-51649143798 10.1007/BF02665064
    • Sunwoo A. J., Morris J. W., Lucey G. K., The growth of Cu-Sn intermetallics at a pretinned copper-solder interface. Metallurgical Transactions A 1992 23 4 1323 1332 2-s2.0-51649143798 10.1007/BF02665064
    • (1992) Metallurgical Transactions A , vol.23 , Issue.4 , pp. 1323-1332
    • Sunwoo, A.J.1    Morris, J.W.2    Lucey, G.K.3
  • 55
    • 0029389630 scopus 로고
    • The role of Cu-Sn intermetallics in wettability degradation
    • 2-s2.0-0029389630 10.1007/BF02655460
    • Reynolds H. L., Morris J. W., The role of Cu-Sn intermetallics in wettability degradation. Journal of Electronic Materials 1995 24 10 1429 1434 2-s2.0-0029389630 10.1007/BF02655460
    • (1995) Journal of Electronic Materials , vol.24 , Issue.10 , pp. 1429-1434
    • Reynolds, H.L.1    Morris, J.W.2
  • 58
    • 70349728579 scopus 로고    scopus 로고
    • Lead-free soldering: Materials science and solder joint reliability
    • 2-s2.0-70349728579 10.1007/s11837-009-0084-9
    • Zeng K., Lead-free soldering: materials science and solder joint reliability. JOM 2009 61 6 28 2-s2.0-70349728579 10.1007/s11837-009-0084-9
    • (2009) JOM , vol.61 , Issue.6 , pp. 28
    • Zeng, K.1
  • 59
    • 70349751731 scopus 로고    scopus 로고
    • Microstructural coarsening in Sn-Ag-based solders and its effects on mechanical properties
    • 2-s2.0-70349751731 10.1007/s11837-009-0085-8
    • Dutta I., Kumar P., Subbarayan G., Microstructural coarsening in Sn-Ag-based solders and its effects on mechanical properties. JOM 2009 61 6 29 38 2-s2.0-70349751731 10.1007/s11837-009-0085-8
    • (2009) JOM , vol.61 , Issue.6 , pp. 29-38
    • Dutta, I.1    Kumar, P.2    Subbarayan, G.3
  • 60
    • 33846482155 scopus 로고    scopus 로고
    • Phase transformation and microstructural evolution in solder joints
    • DOI 10.1007/s11837-007-0008-5
    • Chen S. W., Wang C. H., Lin S. K., Chiu C. N., Chen C. C., Phase transformation and microstructural evolution in solder joints. JOM 2007 59 1 39 43 2-s2.0-33846482155 10.1007/s11837-007-0008-5 (Pubitemid 46165046)
    • (2007) JOM , vol.59 , Issue.1 , pp. 39-43
    • Chen, S.-W.1    Wang, C.-H.2    Lin, S.-K.3    Chiu, C.-N.4    Chen, C.-C.5
  • 61
    • 15544371362 scopus 로고    scopus 로고
    • Intermetallic compounds growth between Sn-3.5Ag lead-free solder and Cu substrate by dipping method
    • DOI 10.1016/j.jallcom.2004.09.023, PII S0925838804012137
    • Yu D. Q., Wu C. M. L., Law C. M. T., Wang L., Lai J. K. L., Intermetallic compounds growth between Sn-3.5Ag lead-free solder and Cu substrate by dipping method. Journal of Alloys and Compounds 2005 392 1-2 192 199 2-s2.0-15544371362 10.1016/j.jallcom.2004.09.023 (Pubitemid 40402894)
    • (2005) Journal of Alloys and Compounds , vol.392 , Issue.1-2 , pp. 192-199
    • Yu, D.Q.1    Wu, C.M.L.2    Law, C.M.T.3    Wang, L.4    Lai, J.K.L.5
  • 62
    • 79955598843 scopus 로고    scopus 로고
    • Effect of soldering condition on formation of intermetallic phases developed between Sn-0.3Ag-0.7Cu low-silver lead-free solder and Cu substrate
    • 2-s2.0-79955598843 10.1016/j.jallcom.2011.03.049
    • Mookam N., Kanlayasiri K., Effect of soldering condition on formation of intermetallic phases developed between Sn-0.3Ag-0.7Cu low-silver lead-free solder and Cu substrate. Journal of Alloys and Compounds 2011 509 21 6276 6279 2-s2.0-79955598843 10.1016/j.jallcom.2011.03.049
    • (2011) Journal of Alloys and Compounds , vol.509 , Issue.21 , pp. 6276-6279
    • Mookam, N.1    Kanlayasiri, K.2
  • 63
    • 0142165074 scopus 로고    scopus 로고
    • Formation and Growth Kinetics of Interfacial Intermetallics in Pb-Free Solder Joint
    • 2-s2.0-0142165074 10.1109/TCAPT.2003.817860
    • Li G. Y., Chen B. L., Formation and Growth Kinetics of Interfacial Intermetallics in Pb-Free Solder Joint. IEEE Transactions on Components and Packaging Technologies 2003 26 3 651 658 2-s2.0-0142165074 10.1109/TCAPT.2003. 817860
    • (2003) IEEE Transactions on Components and Packaging Technologies , vol.26 , Issue.3 , pp. 651-658
    • Li, G.Y.1    Chen, B.L.2
  • 64
    • 0030216469 scopus 로고    scopus 로고
    • Reliability studies of surface mount solder joints - Effect of Cu-Sn intermetallic compounds
    • PII S1070989496050165
    • So A. C. K., Chan Y. C., Reliability studies of surface mount solder joints-effect of Cu-Sn intermetallic compounds. IEEE Transactions on Components Packaging and Manufacturing Technology Part B 1996 19 3 661 668 2-s2.0-0030216469 (Pubitemid 126804905)
    • (1996) IEEE Transactions on Components Packaging and Manufacturing Technology Part B , vol.19 , Issue.3 , pp. 661-668
    • So, A.C.K.1    Chan, Y.C.2
  • 65
    • 35648929907 scopus 로고    scopus 로고
    • Effect of thermal aging on the interfacial structure of SnAgCu solder joints on Cu
    • DOI 10.1016/j.microrel.2006.12.006, PII S0026271407001035, Electronic system prognostics and health management
    • Peng W., Monlevade E., Marques M. E., Effect of thermal aging on the interfacial structure of SnAgCu solder joints on Cu. Microelectronics Reliability 2007 47 12 2161 2168 2-s2.0-35648929907 10.1016/j.microrel.2006.12. 006 (Pubitemid 350019609)
    • (2007) Microelectronics Reliability , vol.47 , Issue.12 , pp. 2161-2168
    • Peng, W.1    Monlevade, E.2    Marques, M.E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.