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Volumn 392, Issue 1-2, 2005, Pages 247-252

IMC morphology, interfacial reaction and joint reliability of Pb-free Sn-Ag-Cu solder on electrolytic Ni BGA substrate

Author keywords

Intermetallic compounds; Pb free solder; Shear test; Sn Ag Cu Solder

Indexed keywords

COPPER; EUTECTICS; GROWTH KINETICS; INTERFACES (MATERIALS); INTERMETALLICS; METALLIZING; MORPHOLOGY; SHEAR STRENGTH; SILVER; SOLDERED JOINTS; SOLIDIFICATION; THERMAL EFFECTS; TIN ALLOYS;

EID: 15544387649     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.09.045     Document Type: Article
Times cited : (119)

References (13)
  • 9
    • 15544379636 scopus 로고    scopus 로고
    • http://www.nemi.org/projects/ese/if_assembly.html.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.