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Volumn 392, Issue 1-2, 2005, Pages 247-252
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IMC morphology, interfacial reaction and joint reliability of Pb-free Sn-Ag-Cu solder on electrolytic Ni BGA substrate
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Author keywords
Intermetallic compounds; Pb free solder; Shear test; Sn Ag Cu Solder
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Indexed keywords
COPPER;
EUTECTICS;
GROWTH KINETICS;
INTERFACES (MATERIALS);
INTERMETALLICS;
METALLIZING;
MORPHOLOGY;
SHEAR STRENGTH;
SILVER;
SOLDERED JOINTS;
SOLIDIFICATION;
THERMAL EFFECTS;
TIN ALLOYS;
JOINT STRENGTH;
PB-FREE SOLDER;
SHEAR TESTS;
SN-AG-CU SOLDER;
SOLDERING ALLOYS;
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EID: 15544387649
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2004.09.045 Document Type: Article |
Times cited : (119)
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References (13)
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