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European Physical Journal: Special Topics

Volumn 208, Issue 1, 2012, Pages 189-216

Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures

(6) Favre Nicolin, V a Proietti, M G b Leclere, C c Katcho, N A b,d Richard, M I e Renevier, H c

a UNIV GRENOBLE ALPES (France)

b CSIC (Spain)

c LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE (France)

d INSTITUTO DE QUÍMICA FÍSICA ROCASOLANO (Spain)

e AIX MARSEILLE UNIVERSITY (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84862594464 PISSN: 19516355 EISSN: 19516401 Source Type: Journal
DOI: 10.1140/epjst/e2012-01619-x Document Type: Review

Times cited : (23)

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