Absorption and extinction correction in quantitative DAFS analysis

Journal of Synchrotron Radiation

Volumn 10, Issue 2, 2003, Pages 144-147

  Meyer, Dirk C ^a   Kupsch, Andreas ^a   Paufler, Peter ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Absorption correction; Attenuation correction; DAFS; Secondary extinction; XAFS

Indexed keywords

ARTICLE;

EID: 0037366783     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049502022343     Document Type: Article

References (11)

1. Kupsch, A., Meyer, D. C., Richter, K. & Paufler, P. (1998). J. Alloys Comput. 266, 207-215.
2. Laue, M. von (1960). Röntgenstrahl-Interferenzen. Frankfurt am Main: Akademische Verlagsgesellschaft.
3. Meyer, D. C. Gawlitza, P., Richter, K. & Paufler, P. (1999). J. Phys. D, 32, 3135-3139.
4. Meyer, D. C. Kupsch, A., Richter, K. & Paufler, P. (1999). J. Synchrotron Rad. 6, 329-331.
5. Meyer, D. C., Richter, K., Wehner, B. & Paufler, P. (1998). Philos. Mag. B, 77, 891-906.
6. Sorensen, L. B., Cross, J. O., Newville, M., Ravel, B., Rehr, J. J., Stragier, H., Bouldin, C. E. & Woicik, J. C. (1994). Resonant Anomalous X-ray Scattering, edited by G. Materlik, C. J. Sparks & K. Fischer, pp. 389-420. Amsterdam: Elsevier.
7. Stout, G. H. & Jensen, L. H. (1989). X-ray Structure Determination, 2nd ed., pp. 390-394. New York/Chichester/Brisbane/Toronto/Singapore: John Wiley and Sons.
8. Stragier, H., Cross, J. O., Rehr, J. J., Sorensen, L. B., Bouldin, C. E. & Woicik, J. C. (1992). Phys. Rev. Lett. 69, 3064-3067.
9. Tomov, I. & Ivanova, K. (1996). Textures Microstruct. 26/27, 59-70.
10. Zachariasen, W. H. (1963). Acta Cryst. 16, 1139-1145.
11. Zachariasen, W. H. (1967). Acta Cryst. 23, 558-564.