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Volumn 81, Issue 27, 2002, Pages 5120-5122

Determination of absolute indium content in InGaN/GaN multiple quantum wells using anomalous x-ray scattering

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRYSTAL LATTICES; GALLIUM NITRIDE; LIGHT ABSORPTION; POISSON RATIO; SEMICONDUCTING INDIUM COMPOUNDS; STRAIN; X RAY SCATTERING;

EID: 0347664056     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1530376     Document Type: Article
Times cited : (20)

References (18)
  • 18
    • 0346498288 scopus 로고    scopus 로고
    • [http://www-cxro.lbl.gov], and [http://physics.nist.gov/PhysRefData/contents.html]
    • http://www.bmsc.washington.edu], [http://www-cxro.lbl.gov], and [http://physics.nist.gov/PhysRefData/contents.html].


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.