In situ investigation of the island nucleation of Ge on Si(001) using x-ray scattering methods

Applied Physics Letters

Volumn 89, Issue 14, 2006, Pages

  Schulli T U ^a   Richard, M I ^a   Renaud, G ^a   Favre Nicolin, V ^a   Wintersberger, E ^b   Bauer, G ^b  

^a CEA GRENOBLE   (France)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE SCATTERING; ANOMALOUS DIFFRACTION; MULTIFACETTED DOMES; STRAIN RELAXATION;

ANGLE MEASUREMENT; NUCLEATION; SILICON; STRAIN; WETTING; X RAY DIFFRACTION;

GERMANIUM;

EID: 33749483201     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2358300     Document Type: Article

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