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Volumn 59, Issue 23, 1999, Pages 15253-15260

X-ray analysis of the short-range order in the ordered-alloy domains of epitaxial (ga,in)p layers by diffraction anomalous fine structure of superlattice reflections

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001230669     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.15253     Document Type: Article
Times cited : (21)

References (19)
  • 14
    • 85037906412 scopus 로고    scopus 로고
    • (Reidel, Dordrecht, 1985), III
    • International Tables for X-Ray Crystallography (Reidel, Dordrecht, 1985), Vol. III.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.