Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography

Nano Letters

Volumn 8, Issue 5, 2008, Pages 1404-1409

  Rastelli, Armando ^a   Stoffel, Mathieu ^a   Malachias, Angelo ^b,c   Merdzhanova, Tsvetelina ^b   Katsaros, Georgios ^b   Kern, Klaus ^b   Metzger, Till H ^c   Schmidt, Oliver G ^a  

^a IFW DRESDEN   (Germany)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

PROBES; SCANNING; SCANNING PROBE MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS;

3D PROFILES; COMPOSITION GRADIENTS; COMPOSITION PROFILES; NANOTOMOGRAPHY; SCANNING PROBES; SINGLE QUANTUM DOTS; STRAINED SIGE/SI; THREE-DIMENSIONAL (3D); WET-CHEMICAL ETCHINGS; X-RAY SCATTERING MEASUREMENTS;

THREE DIMENSIONAL;

QUANTUM DOT;

ARTICLE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; OPTICAL TOMOGRAPHY; SCANNING PROBE MICROSCOPY; THREE DIMENSIONAL IMAGING;

IMAGING, THREE-DIMENSIONAL; MATERIALS TESTING; MICROSCOPY, SCANNING PROBE; NANOTECHNOLOGY; QUANTUM DOTS; TOMOGRAPHY, OPTICAL;

EID: 46749112324     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl080290y     Document Type: Article

References (37)

1. Single Quantum Dots: Fundamentals, Applications and New Concepts; Michler, P., Ed.; Springer: Berlin, 2003.
2. Medeiros-Ribeiro, G.; Stanley Williams, R. Nano Lett. 2007, 7 (2), 223-226.
3. Kamins, T. I.; Medeiros-Ribeiro, G.; Ohlberg, D. A. A.; Stanley Williams, R. J. Appl. Phys. 1999, 85 (2), 1159-1171.
4. Schmidt, O. G.; Denker, U.; Christiansen, S.; Ernst, F. Appl. Phys. Lett. 2002, 81 (14), 2614-2616.
5. De Seta, M.; Capellini, G.; Evangelisti, F.; Spinella, C. J. Appl. Phys. 2002, 92 (1), 614-619.
6. Denker, U.; Stoffel, M.; Schmidt, O. G. Phys. Rev. Lett. 2003. 90 (19), 196102.
7. Ratto, F.; Rosei, F.; Locatelli, A.; Cherifi, S.; Fontana, S.; Heun, S.; Szkutnik, P.-D.; Sgarlata, A.; de Crescenzi, M.; Motta, N. J. Appl. Phys. 2005, 97 (4), 043516.
8. Milekhin, A. G.; Nikiforov, A. I.; Ladanov, M. Y.; Pchelyakov, O. P.; Lobanov, D. N.; Novikov, A. V.; Krasil'Nik, Z. F.; Schulze, S.; Zahn, D. R. T. Physica E 2004, 21 (2-4), 464-468.
9. Hadjisavvas, G.; Kelires, P. C. Phys. Rev. B 2005, 72 (7), 075334.
10. Denker, U.; Rastelli, A.; Stoffel, M.; Tersoff, J.; Katsaros, G.; Costantini, G.; Kern, K.; Jin-Phillipp, N. Y.; Jesson, D. E.; Schmidt, O. G. Phys. Rev. Lett. 2005, 94 (21), 216103.
11. Katsaros, G.; Rastelli, A.; Stoffel, M.; Isella, G.; von Känel, H.; Bittner, A. M.; Tersoff, J.; Denker, U.; Schmidt, O. G.; Costantini, G.; Kern, K. Surf. Sci. 2006, 600 (12), 2608-2613.
12. Tu, Y.; Tersoff, J. Phys. Rev. Lett. 2007, 98 (9), 096103.
13. Leite, M. S.; Medeiros-Ribeiro, G.; Kamins, T. I.; Stanley Williams, R. Phys. Rev. Lett. 2007, 98 (16), 165901.
14. Schülli, T. U.; Stoffel, M.; Hesse, A.; Stangl, J.; Lechner, R. T.; Wintersberger, E.; Sztucki, M.; Metzger, T. H.; Schmidt, O. G.; Bauer, G. Phys. Rev. B 2005, 71 (3), 035326.
15. Magalhães-Paniago, R.; Medeiros-Ribeiro, G.; Malachias, A.; Kycia, S.; Kamins, T. I.; Stanley Williams, R. Phys. Rev. B 2002, 66 (24), 245312.
16. Malachias, A.; Kycia, S.; Medeiros-Ribeiro, G.; Magalhães-Paniago, R.; Kamins, T. I.; Stanley Williams, R. Phys. Rev. Lett. 2003, 91 (17), 176101.
17. Biasiol, G.; Heun, S.; Golinelli, G. B.; Locatelli, A.; Mentes, T. O.; Guo, F. Z.; Hofer, C.; Teichert, C.; Sorba, L. Appl. Phys. Lett. 2005, 87 (22), 223106.
18. Floyd, M.; Zhang, Y.; Driver, K. P.; Drucker, J.; Crozier, P. A.; Smith, D. J. Appl. Phys. Lett. 2003, 82 (9), 1473-1475.
19. Schade, M.; Heyroth, F.; Syrowatka, F.; Leipner, H. S.; Boeck, T.; Hanke, M. Appl. Phys. Lett. 2007, 90 (26), 263101.
20. Offermans, P.; Koenraad, P. M.; Wolter, J. H.; Pierz, K.; Roy, M.; Maksym, P. A. Phys. Rev. B 2005. 72 (16), 165332.
21. Springholz, G.; Abtin, L.; Holý, V. Appl. Phys. Lett. 2007, 90 (11), 113119.
22. Kegel, I.; Metzger, T. H.; Lorke, A.; Peisl, J.; Stangl, J.; Bauer, G.; Nordlund, K.; Schoenfeld, W. V.; Petroff, P. M. Phys. Rev. B 2001, 63 (3), 035318.
23. Arslan, I.; Yates, T. J. V.; Browning, N. D.; Midgley, P. A. Science 2005, 309 (5744), 2195-2198.
24. Inoue, T.; Kita, T.; Wada, O.; Konno, M.; Yaguchi, T.; Kamino, T Appl. Phys. Lett. 2008, 92 (3), 031902.
25. Li, F. H.; Fan, Y. L.; Yang, X. J.; Jiang, Z. M.; Wu, Y. Q.; Zou, J. Appl. Phys. Lett. 2006, 89 (10), 103108.
26. Wu, C.-C.; Hull, R. J. Appl. Phys. 2006, 100 (8), 083510.
27. Magerle, R. Phys. Rev. Lett. 2000, 85 (13), 2749-2752.
28. Stoffel, M.; Malachias, A.; Merdzhanova, T.; Cavallo, F.; Isella, G.; Chrastina, D.; von Känel, H.; Rastelli, A.; Schmidt, O. G. arXiv: 0801.4211v1.
29. Denker, U.; Schmidt, O. G.; Jin-Philipp, N.-Y.; Eberl, K. Appl. Phys. Lett. 2001, 78 (23), 3723-3725.
30. Schülli, T. U.; Stangl, J.; Zhong, Z.; Lechner, R. T.; Sztucki, M.; Metzger, T. H.; Bauer, G. Phys. Rev. Lett. 2003, 90 (6), 066105.
31. Stoffel, M.; Rastelli, A.; Tersoff, J.; Merdzhanova, T.; Schmidt, O. G. Phys. Rev. B 2006, 74 (15), 155326.
32. The image correction, alignment, tomography computation, and visualization were obtained by a software package based on the ITT-IDL Platform. The source can be downloaded at http://www.ifw-dresden.de/institutes/iin/ members/ar5.
33. Schmidt, O. G.; Lange, C.; Eberl, K Appl. Phys. Lett. 1999, 75 (13), 1905-1907.
34. Schülli, T. U.; Richard, M.-I.; Renaud, G.; Favre-Nicolin, V.; Wintersberger, E.; Bauer, G. Appl. Phys. Lett. 2006, 89 (14), 162105.
35. Montalenti, F.; Raiteri, P.; Migas, D. B.; von Känel, H.; Rastelli, A.; Manzano, C.; Costantini, G.; Denker, U.; Schmidt, O. G.; Kern, K.; Miglio, L. Phys. Rev. Lett. 2004, 93 (21), 216102.
36. Marzegalli, A.; Zinovyev, V. A.; Montalenti, F.; Rastelli, A.; Stoffel, M.; Merdzhanova, T.; Schmidt, O. G.; Miglio, L. Phys. Rev. Lett. 2007, 99 (23), 235505.
37. Merdzhanova, T.; Kiravittaya, S.; Rastelli, A.; Stoffel, M.; Denker, U.; Schmidt, O. G. Phys. Rev. Lett. 2006, 96 (22), 226103.