Diffraction-anomalous-fine-structure spectroscopy applied to the study of iii-v strained semiconductors

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 8, 1999, Pages 5479-5492

  Proietti, M G ^a   Renevier, H ^b   Hodeau, J L ^b   Garcia J ^a   Berar J F ^b   Wolfers, P ^b  

^a UNIVERSITY OF ZARAGOZA   (Spain)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000766763     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.5479     Document Type: Article

References (40)

1. See, for example, T R. Chen, Y H. Zhuang, L E. Eng, and A. Yariv, Appl. Phys. Lett.57, 2402 (1990);
2. Jae-Hoon Kim, A. Larsson, and L P. Lee, Appl. Phys. Lett.58, 7 (1991).
3. See, for example, Strained Layer Superlattices Physics, edited by T. Pearsall (Academic, New York, 1990).
4. J. Hornstra and W J. Bartels, J. Cryst. Growth14, 518 (1979).
5. B W. Dodson, J V. Tsao, S T. Picraux, and D M. Cornelison, Phys. Rev. Lett.59, 2455 (1987);
6. P M J. Marée, J C. Barbour, and J F. Van der Veen, J. Appl. Phys.62, 4413 (1987).
7. Y. Cai and M F. Thorpe, Phys. Rev. B46, 15 872 (1992).
8. J C. Mikkelsen Jr. and J B. Boyce, Phys. Rev. B28, 7130 (1983).
9. A. Balzarotti, M. Czyzyk, A. Kisiel, N. Motta, M. Podgorny, and M. Zimnal-Starnawsha, Phys. Rev. B30, 2295 (1984).
10. H. Oyanagi, Y. Takeda, T. Matsushita, T. Ishiguro, T. Yao, and A. Sasaki, Solid State Commun.67, 453 (1988).
11. C. Lamberti, S. Bordiga, F. Boscherini, S. Pascarelli, and G M. Schiavini, Appl. Phys. Lett.64, 1430 (1994);
12. C. Lamberti, S. Bordiga, F. Boscherini, S. Pascarelli, G M. Schiavini, C. Ferrari, L. Lazzarini, and G. Salviati, J. Appl. Phys.76, 4581 (1994).
13. S. Pascarelli, F. Boscherini, C. Lamberti, and S. Mobilio, Phys. Rev. B56, 1936 (1997).
14. M G. Proietti, S. Turchini, J. Garcia, G. Lamble, F. Martelli, and T. Prosperi, J. Appl. Phys.78, 6574 (1995).
15. M G. Proietti, S. Turchini, F. Martelli, J. Garcia, T. Prosperi, D. Chandesris, and J. Vogel, J. Phys. IV7, C2-697 (1997).
16. J C. Woicik, J G. Pellegrino, S H. Southworth, P S. Shaw, B A. Karlin, C E. Bouldin, and K E. Miyano, Phys. Rev. B52, R2281 (1995).
17. H. Stragier, J O. Cross, J J. Rehr, L B. Sorensen, C E. Bouldin, and J C. Woicik, Phys. Rev. Lett.21, 3064 (1992);
18. S. Sorensen, in Resonant Anomalous X-ray Scattering, edited by G. Materlik, C. J. Sparks, and K. Fisher (North-Holland, Amsterdam, 1994).
19. I J. Pickering, M. Sansone, J. Marsch, and G N. George, J. Am. Chem. Soc.115, 6302 (1993).
20. H. Renevier, J L. Hodeau, P. Wolfers, S. Andrieu, J. Weigelt, and R. Frahm, Phys. Rev. Lett.78, 2775 (1997).
21. H. Renevier, J. Weigelt, S. Andrieu, R. Frahm, and D. Raoux, Physica B208-209, 217 (1995).
22. I. Arcon, A. Kodre, D. Glavic, and M. Hribar, J. Phys. (Paris), Colloq.48, C9-1105 (1987).
23. J. O. Cross, Ph.D. thesis, University of Washington, 1996.
24. J. Vacinova, J L. Hodeau, P. Wolfers, J P. Lauriat, and E. Elkaïm, J. Synchrotron Radiat.2, 236 (1995);
25. J L. Hodeau, J. Vacinova, P. Wolfers, Y. Garreau, A. Fontaine, M. Hagelstein, E. Elkaïm, A. Collomb, and J. Muller, Nucl. Instrum. Methods Phys. Res. B97, 115 (1995).
26. D C. Meyer, K. Richter, P. Paufler, and H G. Krane, Cryst. Res. Technol.29, K66 (1994).
27. G. Armelles, M L. Sanjuá, L. Gonzalez, andY. Gonzalez, Appl. Phys. Lett.68, 1805(1996).
28. A. Filipponi, A. Di Cicco, and C R. Natoli, Phys. Rev. B52, 15 122 (1995); and
29. A. Di Cicco, ibid. 15 135 (1995).
30. F. Briones, L. Gonzalez, and A. Ruiz, Appl. Phys. A: Solids Surf.49, 729 (1989);
31. Y. Gonzalez, L. Gonzalez, and F. Briones, J. Vac. Sci. Technol. A13, 73 (1995).
32. J L. Ferrer, J P. Simon, J F. Berar, B. Caillot, E. Fanchon, O. Kaikati, S. Arnaud, M. Guidotti, M. Pirocchi, andM. Roth, J. Synchrotron Radiat.5, 1346(1998).
33. Reports of the International Workshop on Standards and Criteria in Absorption X-Ray Spectroscopy, Brookhaven National Laboratory, 1988, edited by F. W. Lytle, D. E. Sayers, and E. A. Stern [Physica B 158, 701 (1989)].
34. J B. Boyce and J C. Mikkelsen, J. Cryst. Growth98, 37 (1989).
35. T. Sasaki, T. Onda, R. Ito, and N. Ogasawara, Jpn. J. Appl. Phys., Part 125, 231 (1986).
36. J C. Woicik, J G. Pellegrino, B. Steiner, K E. Miyano, S G. Bompadre, L B. Sorensen, T.-L. Lee, and S. Khalid, Phys. Rev. Lett.79, 5026 (1997).
37. A. Amore Bonapasta and G. Scavia, Phys. Rev. B50, 2671 (1994).
38. See K E. Newman, J. Shen, and D. Teng, Superlattices Microstruct.6, 245 (1989), and references therein.
39. O. Brandt, K. Ploog, R. Bierwolf, and M. Hoehenstein, Phys. Rev. Lett.68, 1339 (1992).
40. E. Bergignat, M. Gendry, G. Hollinger, and G. Grenet, Phys. Rev. B49, 13 544 (1994). (1996).