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Volumn 64, Issue 24, 2001, Pages 2454041-2454047
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Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers
a a b b b c c |
Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
DATA ANALYSIS;
INCIDENCE;
PHASE SEPARATION;
RADIATION MEASUREMENT;
RADIATION SCATTERING;
STRUCTURE ANALYSIS;
THERMOSTABILITY;
X RAY DIFFRACTION;
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EID: 0035894486
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.64.245404 Document Type: Article |
Times cited : (25)
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References (18)
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