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Volumn 64, Issue 24, 2001, Pages 2454041-2454047

Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DATA ANALYSIS; INCIDENCE; PHASE SEPARATION; RADIATION MEASUREMENT; RADIATION SCATTERING; STRUCTURE ANALYSIS; THERMOSTABILITY; X RAY DIFFRACTION;

EID: 0035894486     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.245404     Document Type: Article
Times cited : (25)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.