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Volumn 243, Issue 7, 2006, Pages 1519-1523

In situ and ex situ grazing incidence diffraction anomalous fine structure study of GaN/AIN quantum dots

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Indexed keywords


EID: 33745755072     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200565247     Document Type: Conference Paper
Times cited : (3)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.