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Volumn 59, Issue 10, 2012, Pages 855-872

Recent progress in source development for extreme UV lithography

Author keywords

conversion efficiency; EUV lithography; laser produced plasma; tin emission

Indexed keywords

EXPOSURE TOOL; EXTREME ULTRAVIOLET; EXTREME UV LITHOGRAPHIES; HIGH-VOLUME MANUFACTURING; IN-BAND; LASER DESIGNS; MANUFACTURING TOOLS; MOORE'S LAW; OPTICAL POWER; PLASMA PROCESS; POWER OUT PUT; RECENT PROGRESS; SEMI-CONDUCTOR FABRICATION; TIN DROPLETS; TIN PLASMA;

EID: 84861051643     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500340.2012.678399     Document Type: Review
Times cited : (16)

References (68)
  • 2
    • 84861090462 scopus 로고    scopus 로고
    • Barcelona, Spain, October 17, 2006
    • van den Brink, M. Presented at the EUVL Symposium, Barcelona, Spain, October 17, 2006
    • EUVL Symposium
    • Van Den Brink, M.1
  • 3
    • 84861048917 scopus 로고    scopus 로고
    • Chinese Academy of Sciences accessed Feb 1, 2012
    • Chinese Academy of Sciences. http://www.english.ime.cas.cn (accessed Feb 1, 2012)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.