High-resolution spectrum of xenon ions at 13.4 nm

Optics Letters

Volumn 28, Issue 16, 2003, Pages 1478-1480

  Churilov, Sergei ^a,b   Joshi, Yogi N ^a,c   Reader, Joseph ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b INSTITUTE OF SPECTROSCOPY   (Russian Federation)

^c ST FRANCIS XAVIER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EXTRAPOLATION; INDUCTANCE; LITHOGRAPHY; OPTICAL RESOLVING POWER; SPECTRUM ANALYSIS; ULTRAVIOLET RADIATION; XENON;

ENERGY PARAMETERS;

POSITIVE IONS;

EID: 0042427648     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.28.001478     Document Type: Article

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