Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry

Progress in Surface Science

Volumn 86, Issue 11-12, 2011, Pages 328-376

  Oates, T W H ^a   Wormeester, H ^b   Arwin, H ^c  

^a LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

^b UNIVERSITY OF TWENTE   (Netherlands)

^c LINKÖPING UNIVERSITY   (Sweden)

Author keywords

Chirality; Dielectric function; Near field; Permeability; SERS

Indexed keywords

CHEMICAL AND BIOLOGICAL SENSING; DIELECTRIC FUNCTIONS; EFFECTIVE MEDIUM THEORIES; ELLIPSOMETRIC SPECTRA; IN-SITU; MATERIAL NANOSTRUCTURE; METAL FILM DEPOSITION; METAL-DIELECTRIC INTERFACE; MUELLER MATRIX ELLIPSOMETRY; NANOPARTICLE FILMS; NEAR-FIELD; NON-INVASIVE; PARTICLE PLASMON RESONANCE; PHASE INFORMATION; PLASMON RESONANCES; PLASMONIC; PLASMONIC METAMATERIALS; SERS; SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS; SUB-WAVELENGTH HOLES; SURFACE COVERAGES; SURFACE PLASMON POLARITONS; THEORETICAL BASIS; VOLUME PLASMON; WEALTH OF INFORMATION;

BIOLOGY; CHIRALITY; ELECTROMAGNETIC WAVE POLARIZATION; INTERFACES (MATERIALS); MECHANICAL PERMEABILITY; METALLIC FILMS; METAMATERIALS; NANOPARTICLES; PHONONS; PHOTONS; QUANTUM THEORY; SOLIDS; SOLVENTS; SPECTROSCOPIC ELLIPSOMETRY; STEREOCHEMISTRY; SURFACE PLASMON RESONANCE; SURFACES; THIN FILMS; VAPOR DEPOSITION;

PLASMONS;

EID: 81755166286     PISSN: 00796816     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.progsurf.2011.08.004     Document Type: Review

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