Optical characterization of thin colloidal gold films by spectroscopic ellipsometry

Langmuir

Volumn 18, Issue 11, 2002, Pages 4401-4413

  Kooij, E Stefan ^a   Wormeester, Herbert ^a   Brouwer, E A Martijn ^a   Van Vroonhoven, Esther ^a   Van Silfhout, Arend ^a   Poelsema, Bene ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

X-RAY FLUORESCENCE;

ATOMIC FORCE MICROSCOPY; COLLOIDS; COMPUTER SIMULATION; DEPOSITION; DIELECTRIC MATERIALS; ELLIPSOMETRY; EVAPORATION; FLUORESCENCE; GOLD; NANOSTRUCTURED MATERIALS; POLARIZATION; SELF ASSEMBLY; SILICA; SUSPENSIONS (FLUIDS);

THIN FILMS;

EID: 0037188702     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0256127     Document Type: Article

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