Optical negative refraction in bulk metamaterials of nanowires

Science

Volumn 321, Issue 5891, 2008, Pages 930-

  Yao, Jie ^a   Liu, Zhaowei ^a   Liu, Yongmin ^a   Wang, Yuan ^a   Sun, Cheng ^a   Bartal, Guy ^a   Stacy, Angelica M ^a   Zhang, Xiang ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM OXIDE; METAMATERIAL; NANOMATERIAL; NANOWIRE; SILVER;

DIELECTRIC PROPERTY; ELECTROMAGNETIC WAVE; REFRACTION; WAVE PROPAGATION;

ARTICLE; DIODE LASER; ELECTROCHEMISTRY; IMAGING; OPTICAL NEGATIVE REFRACTION; PHYSICAL PARAMETERS; PRIORITY JOURNAL; REFRACTION INDEX; SCANNING ELECTROCHEMICAL MICROSCOPY; SPECTRAL SENSITIVITY; VELOCITY;

EID: 49649096092     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1157566     Document Type: Article

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17. This work was supported by the Air Force Office of Scientific Research Multidisciplinary University Research Initiative Program (grant no. FA9550-04-1-0434) and NSF NSEC under award no. DMI-0327077. The authors thank E. Hajime for assistance in fabrication at the early stage of the work.