Mueller matrices for anisotropic metamaterials generated using 4 × 4 matrix formalism

Thin Solid Films

Volumn 519, Issue 9, 2011, Pages 2668-2673

  Rogers, P D ^a   Kang, T D ^a   Zhou, T ^a   Kotelyanskii, M ^a,b   Sirenko, A A ^a  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^b RUDOLPH TECHNOLOGIES INC   (United States)

Author keywords

4 4 matrix formalism; Anisotropic; Dielectric magnetic; Metamaterial; Mueller matrix; Negative refractive index

Indexed keywords

ANISOTROPIC; DIELECTRIC-MAGNETIC; MATRIX FORMALISM; MUELLER MATRIX; NEGATIVE REFRACTIVE INDEX;

ANISOTROPY; CRYSTAL SYMMETRY; ELECTRONIC EQUIPMENT; LIGHT REFRACTION; MAGNETIC MATERIALS; MAGNETIC PERMEABILITY; MAGNETISM; METAMATERIALS; REFRACTIVE INDEX; REFRACTOMETERS; TENSORS; TRANSFER MATRIX METHOD;

DIELECTRIC MATERIALS;

EID: 79952630121     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.12.066     Document Type: Article

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