Dielectric functions of a growing silver film determined using dynamic in situ spectroscopic ellipsometry

Optics Express

Volumn 16, Issue 4, 2008, Pages 2302-2314

  Oates, T W H ^a   Ryves, L ^a   Bilek, M M M ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; FILM THICKNESS; SILVER; SPECTROSCOPIC ELLIPSOMETRY; SURFACE PLASMON RESONANCE;

DIELECTRIC FUNCTIONS; LORENTZ OSCILLATORS; VOLMER WEBER GROWTH;

DIELECTRIC FILMS;

EID: 39749199082     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.002302     Document Type: Article

References (38)