Optical Anisotropy and Porosity of Anodic Aluminum Oxide Characterized by Spectroscopic Ellipsometry

Electrochemical and Solid-State Letters

Volumn 6, Issue 11, 2003, Pages

  Kooij, E Stefan ^a   Wormeester, Herbert ^a   Gâlcǎ, Aurelian C ^a   Poelsema, Bene ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; ELLIPSOMETRY; POROSITY; THIN FILMS;

OPTICAL ANISOTROPY;

ALUMINA;

EID: 0142250879     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1615351     Document Type: Article

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