Using spectroscopic ellipsometry for quick prediction of number density of nanoparticles bound to non-transparent solid surfaces

Surface Science

Volumn 596, Issue 1-3, 2005, Pages 187-196

  Bhat, Rajendra R ^a   Genzer, Jan ^a  

^a North Carolina State University   (United States)

Author keywords

APTES; Atomic force microscopy; Ellipsometry; Gradient; Nanoparticles; NEXAFS; Polymer brush; Self assembly

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; GRAFT COPOLYMERS; SELF ASSEMBLY; SURFACE STRUCTURE; ULTRAVIOLET SPECTROSCOPY;

APTES; GRADIENTS; NEXAFS; POLYMER BRUSH;

NANOSTRUCTURED MATERIALS;

EID: 27744564400     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.09.014     Document Type: Article

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