Protein monolayers monitored by internal reflection ellipsometry

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 716-721

  Poksinski, M ^a   Arwin, H ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

Author keywords

Ellipsometry; Ferritin; Protein adsorption; Surface plasmon resonance; Total internal reflection

Indexed keywords

ADSORPTION; ELLIPSOMETRY; GOLD; INTERFACES (MATERIALS); LIGHT REFLECTION; SENSITIVITY ANALYSIS; SURFACE PLASMON RESONANCE; THIN FILMS;

BIOSENSING; FERRITIN; PROTEIN ADSORPTION; TOTAL INTERNAL REFLECTION;

PROTEINS;

EID: 17144451659     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.037     Document Type: Conference Paper

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