Optical properties of silver thin films: Three-parameter spectroscopic ellipsometry studies

Journal of the Korean Physical Society

Volumn 29, Issue 3, 1996, Pages 370-376

  An, Ilsin ^a   Oh, Hyekyun ^a  

^a Hanyang University

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030533548     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (23)

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