The method of total internal reflection ellipsometry for thin film characterisation and sensing

Thin Solid Films

Volumn 516, Issue 24, 2008, Pages 8993-9001

  Nabok, Alexei ^a   Tsargorodskaya, Anna ^a  

^a SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

Author keywords

DNA hybridization; Electrostatic self assembly; Immune sensing; Spectroscopic ellipsometry; Surface plasmon resonance; Total internal reflection ellipsometry

Indexed keywords

ELLIPSOMETRY; GEOMETRICAL OPTICS; MOLECULAR BEAM EPITAXY; NUCLEIC ACIDS; OPTICAL PROPERTIES; ORGANIC ACIDS; REFLECTION; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; SURFACE PLASMON RESONANCE; THICK FILMS; THIN FILM DEVICES; THIN FILMS; TIRES; VAPOR DEPOSITION;

CHARACTERISATION; DNA HYBRIDIZATION; DNA HYBRIDIZATIONS; ELECTROSTATIC SELF-ASSEMBLY; EXTERNAL REFLECTION; IMMUNE SENSING; LIQUID MEDIUMS; LOW MOLECULAR WEIGHT TOXINS; OPTICAL DENSITIES; OPTICAL PARAMETERS; SENSING APPLICATIONS; SURFACE PLASMON RESONANCE (SPR); TOTAL INTERNAL REFLECTION ELLIPSOMETRY;

ELECTRON BEAM LITHOGRAPHY;

EID: 52149083091     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.11.077     Document Type: Article

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