Quantitative modelling of the surface plasmon resonances of metal nanoclusters sandwiched between dielectric layers: The influence of nanocluster size, shape and organization

Nanotechnology

Volumn 19, Issue 12, 2008, Pages

  Toudert, J ^a,b   Babonneau, D ^a   Simonot, L ^a   Camelio, S ^a   Girardeau, T ^a  

^a CNRS   (France)

^b INSTITUTO DE ÓPTICA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; OPTICAL ANISOTROPY; OPTICAL FILMS; PARTICLE SIZE; SURFACE PLASMON RESONANCE; TRANSMISSION ELECTRON MICROSCOPY;

ANISOTROPIC DIELECTRIC TENSORS; METAL NANOCLUSTERS; NANOCOMPOSITE LAYERS; OPTICAL RESPONSE;

NANOCLUSTERS;

METAL; NANOCOMPOSITE; NANOPARTICLE; SILICON; SILVER;

ARTICLE; ELECTROMAGNETIC FIELD; ELLIPSOMETRY; EXCITATION; MODEL; MOLECULAR INTERACTION; MORPHOLOGY; OPTICAL ROTATION; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SURFACE PLASMON RESONANCE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 42549102254     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/12/125709     Document Type: Article

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