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Volumn 109, Issue 1, 2005, Pages 146-152

Accurate determination of optical and electronic properties of ultra-thin silver films for biosensor applications

Author keywords

Nanoparticles; Plasmon resonance; Spectroscopic ellipsometry

Indexed keywords

ADSORPTION; ELECTROCHEMISTRY; ELLIPSOMETRY; FILM GROWTH; METALLIC FILMS; NANOSTRUCTURED MATERIALS; PERCOLATION (SOLID STATE); PLASMAS; RAMAN SCATTERING; RESONANCE; SILVER; SPECTROSCOPIC ANALYSIS; SURFACE PLASMON RESONANCE; SURFACE TREATMENT; ULTRATHIN FILMS;

EID: 22944452437     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2005.03.066     Document Type: Article
Times cited : (17)

References (25)
  • 4
    • 0032482824 scopus 로고    scopus 로고
    • Optical absorption of island films of noble metals: Wavelength of the plasma absorption band
    • R. Doremus Optical absorption of island films of noble metals: wavelength of the plasma absorption band Thin Solid Films 326 1998 205 210
    • (1998) Thin Solid Films , vol.326 , pp. 205-210
    • Doremus, R.1
  • 5
    • 0001396017 scopus 로고    scopus 로고
    • Surface-enhanced Raman scattering (SERS) method and instrumentation for genomics and biomedical analysis
    • T. Vo-Dinh, D.L. Stokes, G.D. Griffin, M. Volkan, U.J. Kim, and M.I. Simon Surface-enhanced Raman scattering (SERS) method and instrumentation for genomics and biomedical analysis J. Raman Spectrosc. 30 1999 785 793
    • (1999) J. Raman Spectrosc. , vol.30 , pp. 785-793
    • Vo-Dinh, T.1    Stokes, D.L.2    Griffin, G.D.3    Volkan, M.4    Kim, U.J.5    Simon, M.I.6
  • 6
    • 34250515667 scopus 로고
    • Excitation of nonradiative surface plasma waves in silver by the method of frustrated total reflection
    • A. Otto Excitation of nonradiative surface plasma waves in silver by the method of frustrated total reflection Z. Phys. 216 1968 398 410
    • (1968) Z. Phys. , vol.216 , pp. 398-410
    • Otto, A.1
  • 8
    • 0041691460 scopus 로고
    • Long range surface mode supported by very thin silver films
    • F. Yang, G.W. Bradbury, and J.R. Samples Long range surface mode supported by very thin silver films Phys. Rev. Lett. 66 15 1991 2030
    • (1991) Phys. Rev. Lett. , vol.66 , Issue.15 , pp. 2030
    • Yang, F.1    Bradbury, G.W.2    Samples, J.R.3
  • 11
    • 22944490922 scopus 로고
    • W. Zehden Vacuum 1 1 1951 38
    • (1951) Vacuum , vol.1 , Issue.1 , pp. 38
    • Zehden, W.1
  • 15
    • 12344275296 scopus 로고    scopus 로고
    • Percolation threshold in ultrathin titanium films determined by in-situ spectroscopic ellipsometry
    • T.W.H. Oates, D.R. McKenzie, and M.M.M. Bilek Percolation threshold in ultrathin titanium films determined by in-situ spectroscopic ellipsometry Phys. Rev. B 70 2004 195406
    • (2004) Phys. Rev. B , vol.70 , pp. 195406
    • Oates, T.W.H.1    McKenzie, D.R.2    Bilek, M.M.M.3
  • 17
  • 21
    • 34547217759 scopus 로고
    • Optical Constants of Noble Metals
    • P.B. Johnson, and R.W. Christy Optical Constants of Noble Metals Phys. Rev. B 6 12 1972 4370
    • (1972) Phys. Rev. B , vol.6 , Issue.12 , pp. 4370
    • Johnson, P.B.1    Christy, R.W.2
  • 23
    • 22944492494 scopus 로고    scopus 로고
    • Consideration on the initial growth stage of sputtered Ag thin films observed by ellipsometry
    • H. Shimizu, Y. Hoshi, and S. Kawabata Consideration on the initial growth stage of sputtered Ag thin films observed by ellipsometry Trans. Inst. Elect. Eng. Jpn. 122A 8 2002 755 760
    • (2002) Trans. Inst. Elect. Eng. Jpn. , vol.122 , Issue.8 , pp. 755-760
    • Shimizu, H.1    Hoshi, Y.2    Kawabata, S.3
  • 24
    • 0033424581 scopus 로고    scopus 로고
    • Thickness determination of metal thin films with spectroscopic ellipsometry for X-ray mirror and multilayer applications
    • C. Liu, J. Erdmann, J. Maj, and A. Macrander Thickness determination of metal thin films with spectroscopic ellipsometry for X-ray mirror and multilayer applications J. Vac. Sci. Technol. A 17 5 1999 2741 2748
    • (1999) J. Vac. Sci. Technol. A , vol.17 , Issue.5 , pp. 2741-2748
    • Liu, C.1    Erdmann, J.2    Maj, J.3    MacRander, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.