Real-time plasmon resonance tuning of liquid Ga nanoparticles by in situ spectroscopic ellipsometry

Applied Physics Letters

Volumn 90, Issue 10, 2007, Pages

  Wu, Pae C ^a   Kim, Tong Ho ^a   Brown, April S ^a   Losurdo, Maria ^b   Bruno, Giovanni ^b   Everitt, Henry O ^a,c  

^a USA   (United States)

^b CNR   (Italy)

^c DUKE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM COMPOUNDS; PARTICLE SIZE; REAL TIME SYSTEMS; SAPPHIRE; SPECTROSCOPIC ELLIPSOMETRY; SURFACE PLASMON RESONANCE;

LIQUID GA NANOPARTICLES; PLASMON RESONANCE PHOTON ENERGY; REAL TIME PLASMON RESONANCE TUNING; ROOM TEMPERATURE;

NANOPARTICLES;

EID: 33947182628     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2712508     Document Type: Article

References (22)

1. R. VanDuyne, A. Haes, and A. McFarland, Proc. SPIE 0277-786X 10.1117/12.509862 5223, 197 (2003); J. J. Mock, M. Barbic, D. R. Smith, D. A. Schultz, and S. Schultz, J. Chem. Phys. 0021-9606 10.1063/1.1462610 116, 6755 (2002); Y. Xia and N. J. Halas, MRS Bull. 30, 338348 (2005).
2. R. VanDuyne, A. Haes, and A. McFarland, Proc. SPIE 0277-786X 10.1117/12.509862 5223, 197 (2003); J. J. Mock, M. Barbic, D. R. Smith, D. A. Schultz, and S. Schultz, J. Chem. Phys. 0021-9606 10.1063/1.1462610 116, 6755 (2002); Y. Xia and N. J. Halas, MRS Bull. 30, 338348 (2005).
3. R. VanDuyne, A. Haes, and A. McFarland, Proc. SPIE 0277-786X 10.1117/12.509862 5223, 197 (2003); J. J. Mock, M. Barbic, D. R. Smith, D. A. Schultz, and S. Schultz, J. Chem. Phys. 0021-9606 10.1063/1.1462610 116, 6755 (2002); Y. Xia and N. J. Halas, MRS Bull. 30, 338348 (2005).
4. E. Hutter and J. H. Fendler, Adv. Mater. (Weinheim, Ger.) 16, 1685 (2004).
5. S. A. Maier and H. Atwater, J. Appl. Phys. 0021-8979 10.1063/1.1951057 98, 011101 (2005); A. Neogi, C.-W. Lee, H. O. Everitt, T. Kuroda, A. Takeuchi, and E. Yablonovitch, Phys. Rev. B 66, 153305 (2002).
6. S. A. Maier and H. Atwater, J. Appl. Phys. 0021-8979 10.1063/1.1951057 98, 011101 (2005); A. Neogi, C.-W. Lee, H. O. Everitt, T. Kuroda, A. Takeuchi, and E. Yablonovitch, Phys. Rev. B 66, 153305 (2002).
7. A. V. Krasavin, K. F. MacDonald, A. S. Schwanecke, and N. I. Zheludev, Appl. Phys. Lett. 89, 031118 (2006).
8. D. Tonova, M. Patrini, P. Tognini, A. Stella, P. Cheyssac, and R. Kofman, J. Phys.: Condens. Matter 11, 2211 (1999).
9. K. F. MacDonald, V. A. Fedotov, S. Pochon, G. Stevens, F. V. Kusmartsev, V. I. Emel'yanov, and N. I. Zheludev, Europhys. Lett. 67, 614 (2004).
10. G. B. Parravicini, A. Stella, P. Ghigna, G. Spinolo, A. Migliori, F. d'Acapito, and R. Kofman, Appl. Phys. Lett. 89, 033123 (2006).
11. S. Link, M. B. Mohamed, and M. A. El-Sayed, J. Phys. Chem. B 103, 3073 (1999).
12. H. G. Tompkins and W. A. McGahan, Spectroscopic Ellipsometry and Reflectometry: A User's Guide (Wiley, New York, 1999), p. 17.
13. D. E. Aspnes, J. Opt. Soc. Am. A 10, 974 (1992).
14. H. V. Nguyen, I. An, and R. W. Collins, Phys. Rev. B 47, 3947 (1993).
15. P. Meakin, Rep. Prog. Phys. 55, 157 (1992).
16. P. Tognini, A. Stella, P. Cheyssac, and R. Kofman, J. Non-Cryst. Solids 249, 117 (1999).
17. T. Yamaguchi, S. Yoshida, and A. Kinbara, Thin Solid Films 21, 173 (1973).
18. V. A. Fedotov, V. I. Emel'yanov, K. F. MacDonald, and N. I. Zheludev, J. Opt. A, Pure Appl. Opt. 1464-4258 10.1088/1464-4258/6/2/001 6, 155 (2004); A. Pinchuk, A. Hilger, G. von Plessen, and U. Kreibig, Nanotechnology 15, 1890 (2004).
19. V. A. Fedotov, V. I. Emel'yanov, K. F. MacDonald, and N. I. Zheludev, J. Opt. A, Pure Appl. Opt. 1464-4258 10.1088/1464-4258/6/2/001 6, 155 (2004); A. Pinchuk, A. Hilger, G. von Plessen, and U. Kreibig, Nanotechnology 15, 1890 (2004).
20. T. W. H. Oates and A. Mucklich, Nanotechnology 16, 2606 (2005).
21. A. Yelon, K. N. Piyakis, and E. Sacher, Surf. Sci. 569, 47 (2004);
22. H. Bi, W. Cai, L. Zhang, D. Martin, and F. Traeger, Appl. Phys. Lett. 81, 5222 (2002).