Negative-index metamaterial at 780 nm wavelength

Optics Letters

Volumn 32, Issue 1, 2007, Pages 53-55

  Dolling, G ^a   Wegener, M ^a   Soukoulis, C M ^b   Linden, S ^c  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b IOWA STATE UNIVERSITY   (United States)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

METAMATERIAL DESIGN; NEGATIVE-INDEX METAMATERIAL; TIME-OF-FLIGHT EXPERIMENTS;

LIGHT REFLECTION; OPTICAL DESIGN; REFRACTIVE INDEX; SENSITIVITY ANALYSIS;

OPTICAL MATERIALS;

EID: 33846699629     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.32.000053     Document Type: Article

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