메뉴 건너뛰기




Volumn , Issue , 2005, Pages 637-717

Theory and Application of Generalized Ellipsometry

Author keywords

[No Author keywords available]

Indexed keywords

GENERALIZED ELLIPSOMETRY;

EID: 84882904157     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-081551499-2.50011-3     Document Type: Chapter
Times cited : (36)

References (114)
  • 1
    • 0004076482 scopus 로고
    • Elsevier, Amsterdam, A.C. Boccara, C. Pickering, J. Rivory (Eds.)
    • Spectroscopic Ellipsometry 1993, Elsevier, Amsterdam. A.C. Boccara, C. Pickering, J. Rivory (Eds.).
    • (1993) Spectroscopic Ellipsometry
  • 2
    • 18444373209 scopus 로고    scopus 로고
    • Elsevier, Lausanne, R.W. Collins, D.E. Aspnes, E.A. Irene (Eds.)
    • Spectroscopic Ellipsometry 1997 1997, Elsevier, Lausanne. R.W. Collins, D.E. Aspnes, E.A. Irene (Eds.).
    • (1997) Spectroscopic Ellipsometry 1997
  • 6
    • 0004072342 scopus 로고
    • Cambridge University Press, Cambridge
    • Chandrasekhar S. Liquid Crystals 1992, Cambridge University Press, Cambridge.
    • (1992) Liquid Crystals
    • Chandrasekhar, S.1
  • 13
    • 18444395814 scopus 로고
    • Magneto-optical applications
    • John Wiley & Sons Ltd, London, Ch. 19, J.H. Westbrook, R.L. Fleischer (Eds.)
    • McGahan W.A. Magneto-optical applications. Intermetallic Compounds 1994, Vol. 2:435-451. John Wiley & Sons Ltd, London, Ch. 19. J.H. Westbrook, R.L. Fleischer (Eds.).
    • (1994) Intermetallic Compounds , vol.2 , pp. 435-451
    • McGahan, W.A.1
  • 17
    • 0003511412 scopus 로고
    • Wiley, New York, Wiley Series in Pure and Applied Optics
    • Yeh P. Optical Waves in Llayered Media 1988, Wiley, New York, Wiley Series in Pure and Applied Optics.
    • (1988) Optical Waves in Llayered Media
    • Yeh, P.1
  • 21
    • 0000951093 scopus 로고
    • Generalized Ellipsometry for surfaces with directional preference: application to diffraction gratings
    • Azzam R.M.A., Bashara N.M. Generalized Ellipsometry for surfaces with directional preference: application to diffraction gratings. J. Opt. Soc. Am. 1972, 62:1521-1523.
    • (1972) J. Opt. Soc. Am. , vol.62 , pp. 1521-1523
    • Azzam, R.M.A.1    Bashara, N.M.2
  • 22
    • 0000786817 scopus 로고
    • Polarization transfer function of a biaxial system as a bilinear transformation
    • Azzam R.M.A., Bashara N.M. Polarization transfer function of a biaxial system as a bilinear transformation. J. Opt. Soc. Am. A 1972, 62:502-510.
    • (1972) J. Opt. Soc. Am. A , vol.62 , pp. 502-510
    • Azzam, R.M.A.1    Bashara, N.M.2
  • 23
    • 0001632353 scopus 로고
    • Generalized rotating-compensator ellipsometry
    • Hauge P.S. Generalized rotating-compensator ellipsometry. Surf. Sci. 1976, 56:148-160.
    • (1976) Surf. Sci. , vol.56 , pp. 148-160
    • Hauge, P.S.1
  • 24
    • 0347857671 scopus 로고
    • Generalized ellipsometry and the 4 × 4 matrix formalism
    • DeSmet D.J. Generalized ellipsometry and the 4 × 4 matrix formalism. Surf. Sci. 1976, 56:293-306.
    • (1976) Surf. Sci. , vol.56 , pp. 293-306
    • DeSmet, D.J.1
  • 25
    • 33947400657 scopus 로고
    • Explicit solutions for the optical properties of a uniaxial crystal in generalized ellipsometry
    • Elshazly-Zaghloul M., Azzam R.M.A., Bashara N.M. Explicit solutions for the optical properties of a uniaxial crystal in generalized ellipsometry. Surf. Sci. 1980, 96:41-53.
    • (1980) Surf. Sci. , vol.96 , pp. 41-53
    • Elshazly-Zaghloul, M.1    Azzam, R.M.A.2    Bashara, N.M.3
  • 26
    • 84975602905 scopus 로고
    • Characteristic matrix method for stratified anisotropic media: optical properties of special configurations
    • Wöhler H., Fritsch M., Haas G., Mlynski D.A. Characteristic matrix method for stratified anisotropic media: optical properties of special configurations. J. Opt. Soc. Am. A 1991, 8:536-540.
    • (1991) J. Opt. Soc. Am. A , vol.8 , pp. 536-540
    • Wöhler, H.1    Fritsch, M.2    Haas, G.3    Mlynski, D.A.4
  • 27
    • 0010999734 scopus 로고
    • Light propagation in stratified anisotropic media: orthogonality and symmetry properties of the 4 × 4 matrix formalism
    • Eidner K. Light propagation in stratified anisotropic media: orthogonality and symmetry properties of the 4 × 4 matrix formalism. J. Opt. Soc. Am. A 1989, 6:1657-1660.
    • (1989) J. Opt. Soc. Am. A , vol.6 , pp. 1657-1660
    • Eidner, K.1
  • 29
    • 1642408850 scopus 로고    scopus 로고
    • Two-modulator generalized ellipsometry: theory
    • Jellison G.E., Modine F.A. Two-modulator generalized ellipsometry: theory. Appl. Optics 1998, 36:8184-8189.
    • (1998) Appl. Optics , vol.36 , pp. 8184-8189
    • Jellison, G.E.1    Modine, F.A.2
  • 30
    • 1642408850 scopus 로고    scopus 로고
    • Two-modulator generalized ellipsometry: experiment and calibration
    • Two-modulator generalized ellipsometry: experiment and calibration. Appl. Optics 1998, 36:8190-8198.
    • (1998) Appl. Optics , vol.36 , pp. 8190-8198
  • 31
    • 0032003728 scopus 로고    scopus 로고
    • Determination of optical anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry
    • Thompson D.W., DeVries M.J., Tiwald T.E., Woollam J.A. Determination of optical anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry. Thin Solid Films 1998, 313-314:341-346.
    • (1998) Thin Solid Films , pp. 341-346
    • Thompson, D.W.1    DeVries, M.J.2    Tiwald, T.E.3    Woollam, J.A.4
  • 32
    • 85010114117 scopus 로고    scopus 로고
    • "Specific approach of generalized ellipsometry for the determination of weak in-plane anisotropy: application to Langmuir-Blodgett ultrathin films"
    • B. Lecourt, D. Blaudez, J.M. Turlet: "Specific approach of generalized ellipsometry for the determination of weak in-plane anisotropy: application to Langmuir-Blodgett ultrathin films", J. Opt. Soc. Am. A, 10, 2769-2782.
    • J. Opt. Soc. Am. A, , vol.10 , pp. 2769-2782
    • Lecourt, B.1    Blaudez, D.2    Turlet, J.M.3
  • 34
    • 0032606318 scopus 로고    scopus 로고
    • Spectroscopic Generalized Ellipsometry based on Fourier analysis
    • En Naciri A., Johann L., Kleim R. Spectroscopic Generalized Ellipsometry based on Fourier analysis. Appl. Opt. 1999, 1 Aug.:4802-4811.
    • (1999) Appl. Opt. , pp. 4802-4811
    • En Naciri, A.1    Johann, L.2    Kleim, R.3
  • 35
    • 0010206216 scopus 로고    scopus 로고
    • Generalized magneto-optical ellipsometry
    • Berger A., Pufall M.R. Generalized magneto-optical ellipsometry. Appl. Phys. Lett. 1997, 71:965-967.
    • (1997) Appl. Phys. Lett. , vol.71 , pp. 965-967
    • Berger, A.1    Pufall, M.R.2
  • 39
    • 0000300811 scopus 로고    scopus 로고
    • Ellipsometric characterization of anisotropic porous silicon Fabry-Pérot filters and investigation of temperature effects on capillary condensation efficiency
    • Zangooie S., Jansson R., Arwin H. Ellipsometric characterization of anisotropic porous silicon Fabry-Pérot filters and investigation of temperature effects on capillary condensation efficiency. J. Appl. Phys. 1999, 86:850-858.
    • (1999) J. Appl. Phys. , vol.86 , pp. 850-858
    • Zangooie, S.1    Jansson, R.2    Arwin, H.3
  • 40
    • 0031998640 scopus 로고    scopus 로고
    • Characterization of biaxially-stretched plastic films by generalized ellipsometry
    • Elman J.F., Greener J., Herzinger C.M., Johs B. Characterization of biaxially-stretched plastic films by generalized ellipsometry. Thin Solid Films 1998, 313-314:816-820.
    • (1998) Thin Solid Films , pp. 816-820
    • Elman, J.F.1    Greener, J.2    Herzinger, C.M.3    Johs, B.4
  • 44
    • 0000069396 scopus 로고    scopus 로고
    • Optical Functions of uniaxial ZnO determined by generalized ellipsometry
    • Jellison G.E., Boatner L.A. Optical Functions of uniaxial ZnO determined by generalized ellipsometry. Phys. Rev. B 1998, 58:3586-3589.
    • (1998) Phys. Rev. B , vol.58 , pp. 3586-3589
    • Jellison, G.E.1    Boatner, L.A.2
  • 45
    • 77957143435 scopus 로고
    • J.A. Woollam, Lincoln
    • Guide to using WVASE 1995, J.A. Woollam, Lincoln.
    • (1995) Guide to using WVASE
  • 46
  • 47
    • 34249772681 scopus 로고
    • The transmission properties of stratified chi-roferrite media with obliquely incident plane waves
    • Wenyen Y., Wenbing W. The transmission properties of stratified chi-roferrite media with obliquely incident plane waves. Int. J. Infrared Millim. Waves 1994, 15:593-603.
    • (1994) Int. J. Infrared Millim. Waves , vol.15 , pp. 593-603
    • Wenyen, Y.1    Wenbing, W.2
  • 48
    • 0031190681 scopus 로고    scopus 로고
    • Microstrip slow-wave structures on the bianisotropic substrate
    • Nefedov J.S. Microstrip slow-wave structures on the bianisotropic substrate. Electromagnetics 1997, 17:343-360.
    • (1997) Electromagnetics , vol.17 , pp. 343-360
    • Nefedov, J.S.1
  • 49
    • 0000558996 scopus 로고
    • Normal electromagnetic Waves in gyrotropic magnetooptic layered structures
    • Borisov S.B., Dadoenkova N.N., Lyubchanskii I.L. Normal electromagnetic Waves in gyrotropic magnetooptic layered structures. Opt. Spectrosc. 1993, 74:670-682.
    • (1993) Opt. Spectrosc. , vol.74 , pp. 670-682
    • Borisov, S.B.1    Dadoenkova, N.N.2    Lyubchanskii, I.L.3
  • 50
    • 0029639170 scopus 로고
    • On light propagation in helicoidal bian-isotropic mediums
    • Lakhtakia A., Weiglhofer W. On light propagation in helicoidal bian-isotropic mediums. Proc. R. Soc. Lond. A 1995, 448:419-437.
    • (1995) Proc. R. Soc. Lond. A , vol.448 , pp. 419-437
    • Lakhtakia, A.1    Weiglhofer, W.2
  • 51
    • 33746684439 scopus 로고    scopus 로고
    • Further results on light propagation in helicoidal bianisotropic mediums: oblique propagation
    • Lakhtakia A., Weiglhofer W. Further results on light propagation in helicoidal bianisotropic mediums: oblique propagation. Proc. R. Soc. Lond. A 1997, 453:93-105.
    • (1997) Proc. R. Soc. Lond. A , vol.453 , pp. 93-105
    • Lakhtakia, A.1    Weiglhofer, W.2
  • 52
    • 0028443256 scopus 로고
    • Wave propagation in a continuously twisted biaxial dielectric medium parallel to the helical axis
    • Weiglhofer W.S., Lakhatakia A. Wave propagation in a continuously twisted biaxial dielectric medium parallel to the helical axis. Optik 1994, 96:179-183.
    • (1994) Optik , vol.96 , pp. 179-183
    • Weiglhofer, W.S.1    Lakhatakia, A.2
  • 53
    • 0030192104 scopus 로고    scopus 로고
    • Simple and exact analytic solution for oblique propagation in a cholesteric liquid crystal
    • Lakhatakia A., Weiglhofer W.S. Simple and exact analytic solution for oblique propagation in a cholesteric liquid crystal. Microwave and Opt. Techn. Lett. 1996, 12:245-247.
    • (1996) Microwave and Opt. Techn. Lett. , vol.12 , pp. 245-247
    • Lakhatakia, A.1    Weiglhofer, W.S.2
  • 54
    • 0000053159 scopus 로고
    • Free carrier optical properties of semiconductors
    • North-Holland, Amsterdam, M. Balkanski (Ed.)
    • Pidgeon C.R. Free carrier optical properties of semiconductors. Handbook on Semiconductors 1980, Vol. 2:223-328. North-Holland, Amsterdam. M. Balkanski (Ed.).
    • (1980) Handbook on Semiconductors , vol.2 , pp. 223-328
    • Pidgeon, C.R.1
  • 55
    • 0001291045 scopus 로고    scopus 로고
    • Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry
    • Schubert M., Tiwald T.E., Woollam J.A. Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry. Appl. Opt. 1999, 33:177-187.
    • (1999) Appl. Opt. , vol.33 , pp. 177-187
    • Schubert, M.1    Tiwald, T.E.2    Woollam, J.A.3
  • 56
    • 0000786817 scopus 로고
    • Optics in stratified and anisotropic media: 4 × 4 matrix formulation
    • Berreman D.W. Optics in stratified and anisotropic media: 4 × 4 matrix formulation. J. Opt. Soc. Am. 1972, 62:502-510.
    • (1972) J. Opt. Soc. Am. , vol.62 , pp. 502-510
    • Berreman, D.W.1
  • 57
    • 0242314161 scopus 로고
    • Oblique propagation of electromagnetic waves in a slowly-varying non-isotropic medium
    • Booker H.G. Oblique propagation of electromagnetic waves in a slowly-varying non-isotropic medium. Proc. Roy. Soc. A 1936, 155:235-257.
    • (1936) Proc. Roy. Soc. A , vol.155 , pp. 235-257
    • Booker, H.G.1
  • 58
    • 84912995886 scopus 로고
    • Faster 4 × 4 matrix method for uniaxial inhomogeneous media
    • Wöhler H., Fritsch M., Haas G., Mlynski D.A. Faster 4 × 4 matrix method for uniaxial inhomogeneous media. J. Opt. Soc. Am. A 1988, 5:1554-1557.
    • (1988) J. Opt. Soc. Am. A , vol.5 , pp. 1554-1557
    • Wöhler, H.1    Fritsch, M.2    Haas, G.3    Mlynski, D.A.4
  • 59
    • 0001118048 scopus 로고    scopus 로고
    • Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems
    • Schubert M. Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems. Phys. Rev. B 1996, 53:4265-4274.
    • (1996) Phys. Rev. B , vol.53 , pp. 4265-4274
    • Schubert, M.1
  • 60
    • 0021460964 scopus 로고
    • 4 × 4 matrix formalism for optics in stratified anisotropic media
    • See, for comparison between the 4 × 4 matrix formalism developed respectively by Berreman (Ref. 35) and by Yeh (Ref. 41)
    • Lin-Chung P.J., Teitler S. 4 × 4 matrix formalism for optics in stratified anisotropic media. J. Opt. Soc. Am. A 1984, 1:703-705. See, for comparison between the 4 × 4 matrix formalism developed respectively by Berreman (Ref. 35) and by Yeh (Ref. 41).
    • (1984) J. Opt. Soc. Am. A , vol.1 , pp. 703-705
    • Lin-Chung, P.J.1    Teitler, S.2
  • 61
    • 0031999915 scopus 로고    scopus 로고
    • Generalized Ellipsometry and complex optical systems
    • Schubert M. Generalized Ellipsometry and complex optical systems. Thin Solid Films 1998, 313-314:323.
    • (1998) Thin Solid Films , pp. 323
    • Schubert, M.1
  • 62
    • 49149147498 scopus 로고
    • Optics of anisotropic layered media: A new 4 × 4 matrix algebra
    • Yeh P. Optics of anisotropic layered media: A new 4 × 4 matrix algebra. Surf Sci. 1980, 96:41-53.
    • (1980) Surf Sci. , vol.96 , pp. 41-53
    • Yeh, P.1
  • 63
    • 0000520740 scopus 로고
    • Analysis of multilayer thin film structures containing magneto-optic and anisotropic media at oblique incidence using 2 × 2 matrices
    • Mansuripur M. Analysis of multilayer thin film structures containing magneto-optic and anisotropic media at oblique incidence using 2 × 2 matrices. J. Appl. Phys. 1990, 67:6466-6480.
    • (1990) J. Appl. Phys. , vol.67 , pp. 6466-6480
    • Mansuripur, M.1
  • 64
    • 0000608451 scopus 로고    scopus 로고
    • Optical degeneracies in anisotropic layered media: Treatment of singularities in a 4 × 4 matrix formalism
    • Xu W., Wood L.T., Golding T.D. Optical degeneracies in anisotropic layered media: Treatment of singularities in a 4 × 4 matrix formalism. Phys. Rev. B 2000, 61:1740-1743.
    • (2000) Phys. Rev. B , vol.61 , pp. 1740-1743
    • Xu, W.1    Wood, L.T.2    Golding, T.D.3
  • 65
    • 43949163829 scopus 로고
    • Ellipsometry and reflectance of inhomogeneous and anisotropic media: a new computationally efficient approach
    • Toussaere E., Zyss J. Ellipsometry and reflectance of inhomogeneous and anisotropic media: a new computationally efficient approach. Thin Solid Films 1993, 234:416-438.
    • (1993) Thin Solid Films , vol.234 , pp. 416-438
    • Toussaere, E.1    Zyss, J.2
  • 66
    • 33645440555 scopus 로고
    • Magneto-optical ellipsometry
    • Visnovsky S. Magneto-optical ellipsometry. Czech. J. Phys. B 1986, 36:625-650.
    • (1986) Czech. J. Phys. B , vol.36 , pp. 625-650
    • Visnovsky, S.1
  • 68
    • 0041822977 scopus 로고
    • Extended Jones matrix method II
    • and references therein
    • Gu C., Yeh P. Extended Jones matrix method II. J. Opt. Soc. Am. A 1993, 10:966-973. and references therein.
    • (1993) J. Opt. Soc. Am. A , vol.10 , pp. 966-973
    • Gu, C.1    Yeh, P.2
  • 69
    • 0242698968 scopus 로고
    • Bragg reflection of light from singledomain cholesteric liquid-crystal films
    • Berreman D.W., Scheffer T.J. Bragg reflection of light from singledomain cholesteric liquid-crystal films. Phys. Rev. Lett. 1970, 25:577-581.
    • (1970) Phys. Rev. Lett. , vol.25 , pp. 577-581
    • Berreman, D.W.1    Scheffer, T.J.2
  • 70
    • 0000638322 scopus 로고
    • Optics in stratified media-The use of optical eigenmodes of uniaxial crystals in the 4 × 4-matrix formalism
    • Eidner K., Mayer G., Schmidt M., Schmiedel H. Optics in stratified media-The use of optical eigenmodes of uniaxial crystals in the 4 × 4-matrix formalism. Mol. Cryst. Liq. Cryst. 1989, 172:191-200.
    • (1989) Mol. Cryst. Liq. Cryst. , vol.172 , pp. 191-200
    • Eidner, K.1    Mayer, G.2    Schmidt, M.3    Schmiedel, H.4
  • 71
    • 84975633856 scopus 로고
    • Theory of chiral multilayers
    • Jaggard D.L., Sun X. Theory of chiral multilayers. J. Opt. Soc. Am. A 1992, 9:804-813.
    • (1992) J. Opt. Soc. Am. A , vol.9 , pp. 804-813
    • Jaggard, D.L.1    Sun, X.2
  • 72
    • 84965994220 scopus 로고
    • Electromagnetic wave propagation through a dielectric-chiral interface and through a chiral slab
    • Bassani S., Papas C.H., Engheta N. Electromagnetic wave propagation through a dielectric-chiral interface and through a chiral slab. J. Opt. Soc. Am. A 1988, 5:1450-1459.
    • (1988) J. Opt. Soc. Am. A , vol.5 , pp. 1450-1459
    • Bassani, S.1    Papas, C.H.2    Engheta, N.3
  • 73
    • 0001699907 scopus 로고
    • Elsevier, Amsterdam, S. Mahajan (Ed.) 2nd. Ed.
    • Zunger A., Mahajan S. Handbook of Semiconductors 1995, 1399. Elsevier, Amsterdam, Vol. 3. 2nd. Ed. S. Mahajan (Ed.).
    • (1995) Handbook of Semiconductors , vol.3 , pp. 1399
    • Zunger, A.1    Mahajan, S.2
  • 74
    • 0031185686 scopus 로고    scopus 로고
    • Spontaneous atomic ordering in semiconductor alloys: causes, carriers, and consequencies
    • Zunger A. Spontaneous atomic ordering in semiconductor alloys: causes, carriers, and consequencies. MRS Bull. 1997, 22:20-26.
    • (1997) MRS Bull. , vol.22 , pp. 20-26
    • Zunger, A.1
  • 75
    • 0031185801 scopus 로고    scopus 로고
    • Order and surface processes in III-V semiconductor alloys
    • Stringfellow G.B. Order and surface processes in III-V semiconductor alloys. MRS Bull. 1997, 22:27-32.
    • (1997) MRS Bull. , vol.22 , pp. 27-32
    • Stringfellow, G.B.1
  • 76
    • 35949007792 scopus 로고
    • Optical properties of zinc-blende semiconductor alloys: effects of epitaxial strain and atomic ordering
    • Wei S.-H., Zunger A. Optical properties of zinc-blende semiconductor alloys: effects of epitaxial strain and atomic ordering. Phys. Rev. B 1994, 49:14337.
    • (1994) Phys. Rev. B , vol.49 , pp. 14337
    • Wei, S.-H.1    Zunger, A.2
  • 77
    • 0019077666 scopus 로고    scopus 로고
    • Approximate solution of ellipsometric equations for optically biaxial materials,
    • D.E. Aspnes: Approximate solution of ellipsometric equations for optically biaxial materials, J. Opt. Soc. Am., 70, 1275-1277.
    • J. Opt. Soc. Am., , vol.70 , pp. 1275-1277
    • Aspnes, D.E.1
  • 79
    • 0033645688 scopus 로고    scopus 로고
    • 2 dielecric tensor from 0.148 to 33μ using generalized ellipsometry
    • 2 dielecric tensor from 0.148 to 33μ using generalized ellipsometry. Proc. SPIE 2000, Vol 4103:19.
    • (2000) Proc. SPIE , vol.4103 , pp. 19
    • Tiwald, T.E.1    Schubert, M.2
  • 80
    • 0001311937 scopus 로고    scopus 로고
    • Infrared dielectric anisotropy and phonon modes of sapphire
    • Schubert M., Tiwald T.E., Herzinger C.M. Infrared dielectric anisotropy and phonon modes of sapphire. Phys. Rev. B 2000, 61:8187-8201.
    • (2000) Phys. Rev. B , vol.61 , pp. 8187-8201
    • Schubert, M.1    Tiwald, T.E.2    Herzinger, C.M.3
  • 82
    • 18844368581 scopus 로고    scopus 로고
    • Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry and boron nitride as an example
    • Schubert M., Rheinländer B., Franke E., Neumann H., Tiwald T.E., Woollam J.A., Hahn J., Richter F. Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry and boron nitride as an example. Phys. Rev. B 1997, 56:13306-13313.
    • (1997) Phys. Rev. B , vol.56 , pp. 13306-13313
    • Schubert, M.1    Rheinländer, B.2    Franke, E.3    Neumann, H.4    Tiwald, T.E.5    Woollam, J.A.6    Hahn, J.7    Richter, F.8
  • 83
    • 0034664539 scopus 로고    scopus 로고
    • Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry
    • Kasic A., Schubert M., Einfeldt S., Hommel D., Tiwald T.E. Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry. Phys. Rev. B 2000, 62:7365-7377.
    • (2000) Phys. Rev. B , vol.62 , pp. 7365-7377
    • Kasic, A.1    Schubert, M.2    Einfeldt, S.3    Hommel, D.4    Tiwald, T.E.5
  • 86
    • 0041326111 scopus 로고    scopus 로고
    • Quantitative vector magnetometry using generalized magneto-optical ellipsometry
    • Berger A., Pufall M.R. Quantitative vector magnetometry using generalized magneto-optical ellipsometry. J. Appl. Phys. 1999, 85:4583-4585.
    • (1999) J. Appl. Phys. , vol.85 , pp. 4583-4585
    • Berger, A.1    Pufall, M.R.2
  • 87
    • 84882904675 scopus 로고    scopus 로고
    • "Far-infrared dielectric anisotropy and phonon modes in spontaneously CuPt ordered Ga0.52In0.48P"
    • unpublished.
    • T. Hofmann, V. Gottschalch, and M. Schubert: "Far-infrared dielectric anisotropy and phonon modes in spontaneously CuPt ordered Ga 0.52In 0.48P", unpublished.
    • Hofmann, T.1    Gottschalch, V.2    Schubert, M.3
  • 88
    • 0002499069 scopus 로고    scopus 로고
    • 3) revisited
    • See for example, Academic Press, New York, E.D. Palik (Ed.)
    • 3) revisited. Handbook of Optical Constants 1998, Vol. III:653. See for example, Academic Press, New York. E.D. Palik (Ed.).
    • (1998) Handbook of Optical Constants , vol.3 , pp. 653
    • Tropf, W.J.1    Thomas, M.E.2
  • 89
    • 0004040706 scopus 로고    scopus 로고
    • Optical Properties for the Materials in HOC I and HOC II
    • Academic Press, New York, E.D. Palik (Ed.)
    • Palik E.D. Optical Properties for the Materials in HOC I and HOC II. Handbook of Optical Constants 1998, Vol. II:313. Academic Press, New York. E.D. Palik (Ed.).
    • (1998) Handbook of Optical Constants , vol.2 , pp. 313
    • Palik, E.D.1
  • 90
    • 84882855236 scopus 로고    scopus 로고
    • Aluminum Oxide
    • Academic Press, New York, and references therein, E.D. Palik (Ed.)
    • Gervais F. Aluminum Oxide. Handbook of Optical Constants 1998, Vol. II:177. Academic Press, New York, and references therein. E.D. Palik (Ed.).
    • (1998) Handbook of Optical Constants , vol.2 , pp. 177
    • Gervais, F.1
  • 91
    • 0002864028 scopus 로고    scopus 로고
    • Group III nitride semiconductors for short wavelength light-emmiting devices
    • Orton J.W., Foxon C.T. Group III nitride semiconductors for short wavelength light-emmiting devices. Rep. Prog. Phys. 1998, 61:1-75.
    • (1998) Rep. Prog. Phys. , vol.61 , pp. 1-75
    • Orton, J.W.1    Foxon, C.T.2
  • 93
    • 24044448237 scopus 로고
    • Index of refraction measurements on sapphire at low temperatures and visible wavelength
    • DeFranzo A.C., Pazol B.G. Index of refraction measurements on sapphire at low temperatures and visible wavelength. Appl. Opt. 1993, 32:2224-2234.
    • (1993) Appl. Opt. , vol.32 , pp. 2224-2234
    • DeFranzo, A.C.1    Pazol, B.G.2
  • 95
    • 36449004415 scopus 로고
    • Dependence of the optical properties of semiconductor alloys on the degree of long-range order
    • Wei S.H., Laks D.B., Zunger A. Dependence of the optical properties of semiconductor alloys on the degree of long-range order. App. Phys. Lett. 1993, 62:1937-1939.
    • (1993) App. Phys. Lett. , vol.62 , pp. 1937-1939
    • Wei, S.H.1    Laks, D.B.2    Zunger, A.3
  • 96
    • 0001128538 scopus 로고    scopus 로고
    • Fingerprints of CuPt ordering in III-V semiconductor alloys: valence-band splitting, band-gap reduction, and x-ray structure factors
    • Wei S.-H., Zunger A. Fingerprints of CuPt ordering in III-V semiconductor alloys: valence-band splitting, band-gap reduction, and x-ray structure factors. Phys. Rev. B 1998, 57:8983-8988.
    • (1998) Phys. Rev. B , vol.57 , pp. 8983-8988
    • Wei, S.-H.1    Zunger, A.2
  • 99
    • 0002206915 scopus 로고
    • Optical rotary power of cholesteric liquid crystals
    • Cano R. Optical rotary power of cholesteric liquid crystals. Bull. Soc. Franc. Mineral.Crist. 1967, 90:333-351.
    • (1967) Bull. Soc. Franc. Mineral.Crist. , vol.90 , pp. 333-351
    • Cano, R.1
  • 101
    • 0000933414 scopus 로고
    • Thermodynamic and static properties of liquid crystals
    • Haller I. Thermodynamic and static properties of liquid crystals. Prog. Sol. State Chem. 1975, 10:103-112.
    • (1975) Prog. Sol. State Chem. , vol.10 , pp. 103-112
    • Haller, I.1
  • 102
    • 84990689259 scopus 로고
    • Physical principles underlying the experimental methods for studying the orientational order of liquid crystals
    • see also
    • Limmer St. Physical principles underlying the experimental methods for studying the orientational order of liquid crystals. Fortschr. Phys. 1989, 37:879-931. see also.
    • (1989) Fortschr. Phys. , vol.37 , pp. 879-931
    • Limmer, S.1
  • 103
    • 0000397216 scopus 로고
    • A semiempirical model for liquid-crystal refractive index dispersions
    • Wu S.-T. A semiempirical model for liquid-crystal refractive index dispersions. J. App. Phys. 1991, 69:2080-2087.
    • (1991) J. App. Phys. , vol.69 , pp. 2080-2087
    • Wu, S.-T.1
  • 104
    • 0027105297 scopus 로고
    • Optical and magneto-optical characterization of thin films
    • McGahan W.A., He P., Woollam J.A. Optical and magneto-optical characterization of thin films. Appl. Phys. Commun. 1992, 11:375-401.
    • (1992) Appl. Phys. Commun. , vol.11 , pp. 375-401
    • McGahan, W.A.1    He, P.2    Woollam, J.A.3
  • 107
    • 0001203667 scopus 로고
    • Detecting two magnetization components by the magneto-optical Kerr effect
    • Floraczek J.M., Dan Dahlberg E. Detecting two magnetization components by the magneto-optical Kerr effect. J. Appl. Phys. 1990, 67:7520-7525.
    • (1990) J. Appl. Phys. , vol.67 , pp. 7520-7525
    • Floraczek, J.M.1    Dan Dahlberg, E.2
  • 108
    • 0342714377 scopus 로고    scopus 로고
    • Spectroscopic ellipsometry and magneto-optic Kerr effects in Co/Pt multilayers
    • Gao X., Glenn D.W., Heckens S., Thompson W., Woollam J.A. Spectroscopic ellipsometry and magneto-optic Kerr effects in Co/Pt multilayers. J. Appl. Phys. 1997, 82:4525-4531.
    • (1997) J. Appl. Phys. , vol.82 , pp. 4525-4531
    • Gao, X.1    Glenn, D.W.2    Heckens, S.3    Thompson, W.4    Woollam, J.A.5
  • 109
    • 3843129826 scopus 로고    scopus 로고
    • Determination of the interfacial magneto-optical effects in Co/Pt multilayer structures
    • Gao X., Thompson D.W., Woollam J.A. Determination of the interfacial magneto-optical effects in Co/Pt multilayer structures. Appl. Phys. Lett. 1997, 70:3203-3205.
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 3203-3205
    • Gao, X.1    Thompson, D.W.2    Woollam, J.A.3
  • 114
    • 0000096595 scopus 로고    scopus 로고
    • Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation
    • Herzinger C.M., Johs B., McGahan W.A., Woollam J.A., Paulson W. Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation. J. Appl. Phys. 1998, 83:3323-3336.
    • (1998) J. Appl. Phys. , vol.83 , pp. 3323-3336
    • Herzinger, C.M.1    Johs, B.2    McGahan, W.A.3    Woollam, J.A.4    Paulson, W.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.