Spectroellipsometric characterization of plasma-deposited Au/SiO2 nanocomposite films

Journal of Applied Physics

Volumn 87, Issue 1, 2000, Pages 228-235

  Dalacu, Dan ^a   Martinu, Ludvik ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001382320     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371849     Document Type: Article

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