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Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 16, 2001, Pages 1613051-1613054

X-ray diffraction analysis of the gallium-rich surface of GaAs(001)

(6) Paget, D a Garreau, Y b Sauvage, M b Chiaradia, P c Pinchaux, R b Schmidt, W G d

a LABORATOIRE DE PHYSIQUE DE LA MATIÈRE CONDENSÉE (France)

b UNIVERSITÉ PARIS SACLAY (France)

c UNIVERSITY OF ROME TOR VERGATA (Italy)

d FRIEDRICH SCHILLER UNIVERSITY JENA (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY; ARSENIC; GALLIUM;

ARTICLE; ATOMIC PARTICLE; CHEMICAL BOND; CHEMICAL STRUCTURE; MOLECULAR PHYSICS; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 0035886534 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.64.161305 Document Type: Article

Times cited : (39)

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