메뉴 건너뛰기




Volumn 374, Issue 1-3, 1997, Pages 397-405

Arsenic incorporation kinetics in GaAs(001) homoepitaxy revisited

Author keywords

Adsorption kinetics; Epitaxy; Gallium arsenide; Growth; Molecular beam epitaxy; Reflection high energy electron diffraction (RHEED); Semiconducting films; Semiconducting surfaces

Indexed keywords

ARSENIC; EPITAXIAL GROWTH; REACTION KINETICS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING GALLIUM ARSENIDE; SUBSTRATES; THERMAL EFFECTS;

EID: 0031098131     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)01241-7     Document Type: Article
Times cited : (90)

References (29)
  • 1
    • 0004281127 scopus 로고
    • Ed. S. Mahajan Elsevier, Amsterdam, and references therein
    • See, for example, B.A. Joyce, D.D. Vvedensky and C.T. Foxon, in: Handbook on Semiconductors, Vol. 3, Ed. S. Mahajan (Elsevier, Amsterdam, 1994), and references therein.
    • (1994) Handbook on Semiconductors , vol.3
    • Joyce, B.A.1    Vvedensky, D.D.2    Foxon, C.T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.