Enabling electron diffraction as a tool for determining substrate temperature and surface morphology

Applied Physics Letters

Volumn 79, Issue 19, 2001, Pages 3065-3067

  LaBella, V P ^a   Bullock, D W ^a   Emery, C ^a   Ding, Z ^a   Thibado, P M ^a  

^a UNIVERSITY OF ARKANSAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001241265     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1416477     Document Type: Article

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