Emerging SiGe HBT reliability issues for mixed-signal circuit applications

IEEE Transactions on Device and Materials Reliability

Volumn 4, Issue 2, 2004, Pages 222-236

  Cressler, John D ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Breakdown; HBT; Mixed signal; Noise; Radiation effects; Reliability; SiGe

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; CURRENT DENSITY; ELECTRIC BREAKDOWN; INTEGRATED CIRCUIT LAYOUT; IONIZATION; LOGIC CIRCUITS; OSCILLATIONS; RADIATION EFFECTS; RELIABILITY; SPURIOUS SIGNAL NOISE; STANDARDS;

CIRCUIT DESIGN; CURRENT DENSITY STRESS; MIXED-SIGNAL; SIGE;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 4043146481     PISSN: 15304388     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDMR.2004.826587     Document Type: Review

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