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Volumn , Issue , 2003, Pages 12-13
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On the scaling limits of low-frequency noise in SiGe HBTs
a a a b b a c c c c |
Author keywords
[No Author keywords available]
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Indexed keywords
HETEROJUNCTION BIPOLAR TRANSISTORS;
PHASE NOISE;
SEMICONDUCTOR DEVICES;
SILICON ALLOYS;
SPURIOUS SIGNAL NOISE;
BUILDING BLOCKES;
COMMUNICATIONS SYSTEMS;
GEOMETRICAL SCALING;
HIGH-FREQUENCY WIRELESS;
LOW-FREQUENCY NOISE;
SCALING LIMITATION;
SMALL-SIZE EFFECTS;
STATISTICAL VARIATIONS;
THERMAL NOISE;
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EID: 4043090768
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISDRS.2003.1271972 Document Type: Conference Paper |
Times cited : (3)
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References (6)
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