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Volumn 46, Issue 9, 1999, Pages 1910-1912

Increasing process margin in SiGe heterojunction bipolar technology by adding carbon

Author keywords

Heterojunction bipolar transistor; High frequency devices; Si SiGe:C heterojunction

Indexed keywords

ADDITION REACTIONS; BORON; CARBON; ELECTRIC CURRENTS; OSCILLATIONS; OSCILLATORS (ELECTRONIC); SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0032595351     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.784193     Document Type: Article
Times cited : (22)

References (7)
  • 1
    • 0027815541 scopus 로고
    • High speed SiGe-HBT with very low base sheet resistivity
    • E. Kasper, A. Gruhle, and H. Kibbel, "High speed SiGe-HBT with very low base sheet resistivity," in IEDM Tech. Dig., 1993, pp. 79-81.
    • (1993) IEDM Tech. Dig. , pp. 79-81
    • Kasper, E.1    Gruhle, A.2    Kibbel, H.3
  • 4
    • 0000753710 scopus 로고    scopus 로고
    • y buffer structures with low threading dislocation density
    • y buffer structures with low threading dislocation density," Appl. Phys. Lett., vol. 70, pp. 2713-2715, 1997.
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 2713-2715
    • Osten, H.J.1    Bugiel, E.2
  • 5
    • 0009905710 scopus 로고
    • Influence of low emitter and collector regions on high-frequency performance of SiGe-base HBT's
    • B. Heinemann, F. Herzel, and U. Zillmann, "Influence of low emitter and collector regions on high-frequency performance of SiGe-base HBT's," Solid-State Electron., vol. 38, pp. 1183-1189, 1995.
    • (1995) Solid-State Electron. , vol.38 , pp. 1183-1189
    • Heinemann, B.1    Herzel, F.2    Zillmann, U.3
  • 6
    • 0000782235 scopus 로고    scopus 로고
    • Impact of low carbon concentrations on electrical properties of highly boron-doped SiGe layers
    • H. J. Osten, G. Lippert, P. Gaworzewski, and R. Sorge, "Impact of low carbon concentrations on electrical properties of highly boron-doped SiGe layers," Appl. Phys. Lett., vol. 71, pp. 1522-1524, 1997.
    • (1997) Appl. Phys. Lett. , vol.71 , pp. 1522-1524
    • Osten, H.J.1    Lippert, G.2    Gaworzewski, P.3    Sorge, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.