Ion and electron beam assisted growth of nanometric SimOn structures for near-field microscopy

Review of Scientific Instruments

Volumn 73, Issue 11, 2002, Pages 3901-

  Sanchez E J ^a   Krug II, J T ^a   Xie, X S ^a  

^a HARVARD UNIVERSITY   (United States)

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EID: 18744399844     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1511801     Document Type: Article

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