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Volumn 25, Issue 9, 2000, Pages 631-633
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Field-enhanced scanning optical microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
SHAPE ENHANCEMENT;
ELECTRIC CURRENTS;
ELECTRON TUNNELING;
LASER BEAMS;
LIGHT POLARIZATION;
LIGHT SCATTERING;
OPTICAL RESOLVING POWER;
PHOTODETECTORS;
PHOTODIODES;
PIEZOELECTRIC TRANSDUCERS;
POLYCRYSTALLINE MATERIALS;
REFRACTIVE INDEX;
SCANNING TUNNELING MICROSCOPY;
SURFACE PLASMON RESONANCE;
SURFACE TOPOGRAPHY;
NEAR FIELD SCANNING OPTICAL MICROSCOPY;
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EID: 0001691197
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.25.000631 Document Type: Article |
Times cited : (19)
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References (20)
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