Field enhancement in apertureless near-field scanning optical microscopy

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 18, Issue 12, 2001, Pages 2988-3006

  Bohn, John L ^a   Nesbitt, D J ^a   Gallagher, A ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; GLASS; IMAGE ENHANCEMENT; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SILICON; SURFACE PLASMON RESONANCE;

OPTICAL FIELDS;

OPTICAL SYSTEMS;

EID: 0000914528     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.18.002998     Document Type: Article

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