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Volumn 362, Issue 1817, 2004, Pages 843-860

Near-field second-harmonic generation

Author keywords

Electromagnetic field enhancement; Materials imaging; Nanoscale light sources; Near field optical microscopy; Second harmonic generation

Indexed keywords


EID: 1842484825     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.2003.1350     Document Type: Review
Times cited : (20)

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